ISL3158AEMBZ Intersil, ISL3158AEMBZ Datasheet - Page 7

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ISL3158AEMBZ

Manufacturer Part Number
ISL3158AEMBZ
Description
TXRX ESD 5V RS485/422 8-SOIC
Manufacturer
Intersil
Type
Transceiverr
Datasheet

Specifications of ISL3158AEMBZ

Number Of Drivers/receivers
1/1
Protocol
RS422, RS485
Voltage - Supply
4.5 V ~ 5.5 V
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Electrical Specifications
NOTES:
10. See Figure 8 for more information, and for performance over-temperature.
12. Limits established by characterization and are not production tested.
Test Circuits and Waveforms
11. For wafer sale, the switching test limits are established by characterization.
Receiver Enable to Output High
Receiver Disable from Output Low
Receiver Disable from Output High
Time to Shutdown
Receiver Enable from Shutdown to
Output High
Receiver Enable from Shutdown to
Output Low
2. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless
3. Supply current specification is valid for loaded drivers when DE = 0V.
4. Applies to peak current. See “Typical Performance Curves” beginning on page 12 for more information.
5. Keep RE = 0 to prevent the device from entering SHDN.
6. The RE signal high time must be short enough (typically <100ns) to prevent the device from entering SHDN.
7. Transceivers are put into shutdown by bringing RE high and DE low. If the inputs are in this state for less than 60ns, the parts are guaranteed
8. Keep RE = VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN.
9. Set the RE signal high time >600ns to ensure that the device enters SHDN.
otherwise specified.
not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are guaranteed to have entered shutdown. See “Low Power
Shutdown Mode” on page 11.
V
CC
PARAMETER
DE
DI
FIGURE 1A. V
D
Z
Y
7
OD
V
Test Conditions: V
(Note 2). Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified.
Temperature limits established by characterization and are not production tested. (Continued)
OD
t
t
SYMBOL
ZH(SHDN)
ZL(SHDN)
AND V
t
SHDN
t
t
t
ZH
HZ
LZ
OC
R
R
L
L
/2
/2
R
(Note 6)
R
R
(Notes 7, 12)
R
(Notes 7, 9)
R
(Notes 7, 9)
FIGURE 1. DC DRIVER TEST CIRCUITS
L
L
L
L
L
CC
= 1kΩ, C
= 1kΩ, C
= 1kΩ, C
= 1kΩ, C
= 1kΩ, C
V
OC
= 4.5V to 5.5V; Unless Otherwise Specified. Typicals are at V
L
L
L
L
L
TEST CONDITIONS
ISL3158AE
= 15pF, SW = GND (Figure 6),
= 15pF, SW = V
= 15pF, SW = GND (Figure 6)
= 15pF, SW = GND (Figure 6),
= 15pF, SW = V
V
CC
CC
CC
(Figure 6)
(Figure 6),
DE
DI
FIGURE 1B. V
D
TEMP
Z
Y
(°C)
Full
Full
Full
Full
Full
Full
OD
WITH COMMON MODE LOAD
V
MIN
60
OD
-
-
-
-
-
CC
TYP
160
R
7
8
8
-
-
L
= 5V, T
= 60Ω
A
MAX
600
200
200
15
15
15
= +25°C
375Ω
375Ω
-7V TO +12V
April 3, 2009
FN6886.0
UNITS
V
ns
ns
ns
ns
ns
ns
CM

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