SAM3N00A Atmel Corporation, SAM3N00A Datasheet - Page 201

• Manufacturer Part Number: SAM3N00A
• Manufacturer: Atmel Corporation

11. Debug and Test Features
11.1
11.2
11011A–ATARM–04-Oct-10
Description
Embedded Characteristics
The SAM3 Series Microcontrollers feature a number of complementary debug and test
capabilities. The Serial Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port
(SW-DP) and JTAG Debug(JTAG-DP) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. It also embeds a serial wire trace.
Figure 11-1. Debug and Test Block Diagram
• Debug access to all memory and registers in the system, including Cortex-M3 register bank
• Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access
• Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches
• Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and
• Instrumentation Trace Macrocell (ITM) for support of printf style debugging
• IEEE1149.1 JTAG Boundary-can on All Digital Pins
when the core is running, halted, or held in reset.
system profiling
Boundary
TAP
SWJ-DP
Reset
Test
and
POR
JTAGSEL
TDO/TRACESWO
TMS
TCK/SWCLK
TDI
TST
SAM3N
201