74f114sc NXP Semiconductors, 74f114sc Datasheet - Page 3

• Manufacturer Part Number: 74f114sc
• Description: Dual J-k Negative Edge-triggered Flip-flop With Common Clock And Reset
• Manufacturer: NXP Semiconductors

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
4. Measure I
Philips Semiconductors
RECOMMENDED OPERATING CONDITIONS
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES:
1996 Mar 14
V
V
V
I
I
I
T
V
V
V
V
V
I
I
I
I
I
I
I
IK
OH
OL
I
IH
IL
IL
OS
CC
SYMBOL
SYMBOL
SYMBOL
SYMBOL
amb
CC
IH
IL
OH
OH
OL
OL
IK
Dual J-K negative edge-triggered flip-flop
with common clock and reset
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
CC
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
High-level output voltage
High-level output voltage
Low-level output voltage
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High-level input current
L
Low-level input current
Low-level input current
Short-circuit output current
Supply current (total)
with the clock input grounded and all outputs open, with the Q and Q outputs High in turn.
l
l i
CC
PARAMETER
PARAMETER
= 5V, T
OS
4
tests should be performed last.
amb
3
= 25 C.
PARAMETER
PARAMETER
Jn, Kn
SDn
CP
RD
V
V
V
V
V
V
V
V
V
V
V
V
CC
IH
CC
IH
CC
CC
CC
CC
CC
CC
CC
= MIN, I
= MIN, I
= MIN, V
= MIN, V
= MIN, I
= MAX, V
= MAX, V
= MAX V
= MAX, V
= MAX
= MAX
MAX V
TEST CONDITIONS
TEST CONDITIONS
OS
3
, the use of high-speed test apparatus and/or sample-and-hold
OH
OL
I
IL
IL
= I
I
I
I
I
= MAX
= MAX
= 7.0V
= 2.7V
= 0 5V
= 0.5V
= MAX
= MAX
IK
0 5V
10%V
10%V
5%V
5%V
1
1
MIN
CC
CC
4.5
2.0
CC
CC
0
MIN
–60
2.5
2.7
LIMITS
NOM
5.0
LIMITS
TYP
–0.73
0.35
0.35
3.4
15
2
MAX
–18
+70
5.5
0.8
–1
20
MAX
–150
0.50
0.50
–1.2
–0.6
–4.8
–3.0
–6.0
100
Product specification
20
21
74F114
UNIT
UNIT
UNIT
UNIT
mA
mA
mA
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
V
V
C
A
A