lh28f016sct-zr Sharp Microelectronics of the Americas, lh28f016sct-zr Datasheet - Page 33

• Manufacturer Part Number: lh28f016sct-zr
• Description: Flash Memory 16mbit 2mbitx8
• Manufacturer: Sharp Microelectronics of the Americas

NOTES:
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE# may be delayed up to t
3. Sampled, not 100% tested.
4. See Ordering Information for device speeds (valid operational combinations).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard
t
t
t
t
t
t
t
t
t
t
AVAV
AVQV
ELQV
PHQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
OH
Sym.
Configuration) for testing characteristics.
Configuration) for testing characteristics.
Read Cycle Time
Address to Output Delay
CE# to Output Delay
RP# High to Output Delay
OE# to Output Delay
CE# to Output in Low Z
CE# High to Output in High Z
OE# to Output in Low Z
OE# High to Output in High Z
Output Hold from Address, CE# or OE#
Change, Whichever Occurs First
Versions
Parameter
(4)
ELQV
V
-t
CC
GLQV
=5V±0.5V, 5V±0.25V, T
after the falling edge of CE# without impact on t
V
V
CC
CC
=5V±0.25V LH28F016SC-L90
=5V±0.5V
LHF16CZR
Notes
2
2
3
3
3
3
3
A
=0°C to +70°C
Min.
90
0
0
0
Max.
400
90
90
40
55
10
(5)
Min.
100
LH28F016SC-
0
0
0
ELQV
L100
.
(6)
Max.
100
100
400
45
55
10
Rev. 1.2
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
30