SST45VF010-10-4C-SA SST [Silicon Storage Technology, Inc], SST45VF010-10-4C-SA Datasheet - Page 6

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SST45VF010-10-4C-SA

Manufacturer Part Number
SST45VF010-10-4C-SA
Description
512 Kbit / 1 Mbit / 2 Mbit Serial Flash
Manufacturer
SST [Silicon Storage Technology, Inc]
Datasheet
T
© 2000 Silicon Storage Technology, Inc.
T
T
Note: 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
Symbol
N
T
V
V
I
ABLE
ABLE
ABLE
LTH
Symbol
F
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
Parameter
C
C
DR
ZAP_HBM
ZAP_MM
END
CLK
SCKH
SCKL
CES
CEH
CPH
CHZ
CLZ
RLZ
DS
DH
OH
V
WPS
WPH
SE
SCE
BP
RST
REC
PURST
OUT
IN
1
1
1
1
8: AC O
6: C
7: R
1
1
1
APACITANCE
ELIABILITY
Parameter
Serial Clock Frequency
Serial Clock High Time
Serial Clock Low Time
CE# Setup Time
CE# Hold Time
CE# High Time
CE# High to High-Z Output
CE# Low to Low-Z Output
RESET# Low to High-Z Output
Data In Setup Time
Data In Hold Time
Output Hold from SCK Change
Output Valid from SCK
Write Protect Setup Time
Write Protect Hold Time
Sector-Erase
Chip-Erase
Byte-Program
Reset Pulse Width
Reset Recovery Time
Reset Time After Power-Up
PERATING
Parameter
Endurance
Data Retention
ESD Susceptibility
Human Body Model
ESD Susceptibility
Machine Model
Latch Up
Output Pin Capacitance
C
(Ta = 25 °C, f=1 Mhz, other pins open)
HARACTERISTICS
Input Capacitance
C
HARACTERISTICS
Description
V
DD
Minimum Specification
= 2.7-3.6V
100 + I
10,000
2000
100
200
Min
250
250
250
DD
45
45
20
20
10
10
10
10
6
SST45VF512 / SST45VF010 / SST45VF020
0
0
Test Condition
V
512 Kbit / 1 Mbit / 2 Mbit Serial Flash
V
OUT
IN
Limits
Max
100
10
25
25
35
25
20
= 0v
1
= 0V
Cycles
Years
Units
Volts
Volts
mA
514 PGM T8.2
Units
MHz
ms
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
µs
µs
µs
JEDEC Standard A103
JEDEC Standard A115
JEDEC Standard 78
Test Method
JEDEC Standard A117
JEDEC Standard A114
Maximum
Advance Information
12 pF
6 pF
S71178
514 PGM T6.0
514 PGM T7.0
514-1 10/00

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