HCS132DMSR INTERSIL [Intersil Corporation], HCS132DMSR Datasheet

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HCS132DMSR

Manufacturer Part Number
HCS132DMSR
Description
Radiation Hardened Quad 2-Input NAND Schmitt Trigger
Manufacturer
INTERSIL [Intersil Corporation]
Datasheet
August 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Cosmic Ray Upset Immunity < 2 x 10
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
• Input Current Levels Ii
Description
The Intersil HCS132MS is a Radiation Hardened Quad 2-Input
NAND Schmitt Trigger inputs. A high on both inputs forces the
output to a Low state.
The HCS132MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCS132MS is supplied in a 14 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
HCS132DMSR
HCS132KMSR
HCS132D/
Sample
HCS132K/
Sample
HCS132HMSR
(Typ)
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
NUMBER
PART
TEMPERATURE
-55
-55
o
o
RANGE
C to +125
C to +125
+25
+25
+25
10
o
o
o
C
C
C
RAD (Si)/s 20ns Pulse
5 A at VOL, VOH
o
o
C
C
Intersil Class
S Equivalent
Intersil Class
S Equivalent
Sample
Sample
Die
SCREENING
12
o
C to +125
LEVEL
RAD (Si)/s
-9
Errors/Gate Day (Typ
o
-9
C
2
14 Lead SBDIP
14 Lead Ceramic
Flatpack
14 Lead SBDIP
14 Lead Ceramic
Flatpack
Die
/mg
Errors/Bit-Day
PACKAGE
133
Quad 2-Input NAND Schmitt Trigger
Pinouts
NOTE: L = Logic Level Low, H = Logic level High
Functional Diagram
(2, 5, 10, 13)
(1, 4, 9, 12)
GND
nO
HCS132MS
nA
A1
B1
A2
B2
Y1
Y2
An
H
H
L
L
FLATPACK PACKAGE (FLATPACK)
14 LEAD CERAMIC DUAL-IN-LINE
14 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
GND
INPUTS
MIL-STD-1835 CDFP3-F14
A1
B1
Y1
A2
B2
Y2
MIL-STD-1835 CDIP2-T14
1
2
3
4
5
6
7
TRUTH TABLE
1
2
3
4
5
6
7
TOP VIEW
TOP VIEW
Radiation Hardened
Bn
H
H
L
L
Spec Number
14
13
12
11
10
9
8
File Number
14
13
12
11
10
9
8
VCC
B4
A4
Y4
B3
A3
Y3
OUTPUTS
Yn
(3, 6, 8, 11)
H
H
H
L
nY
518750
3061.1
VCC
B4
A4
Y4
B3
A3
Y3

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HCS132DMSR Summary of contents

Page 1

... This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. The HCS132MS is supplied lead Ceramic flatpack (K suffi SBDIP Package (D suffix). Ordering Information PART TEMPERATURE SCREENING NUMBER RANGE o o HCS132DMSR - +125 C Intersil Class S Equivalent o o HCS132KMSR - +125 C ...

Page 2

Absolute Maximum Ratings Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V Input Voltage ...

Page 3

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Input to Output TPLH VCC = 4.5V TPHL VCC = 4.5V Input Switch Points Vt+ VCC = 4.5V Vt- VCC = 4.5V VH VCC = 4.5V NOTES: 1. All voltages referenced to ...

Page 4

TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) PARAMETER SYMBOL Output Voltage Low VOL VCC = 4.5V and 5.5V, VIH = 0.70(VCC), VIL = 0.30(VCC), IOL = 50 A Output Voltage High VOH VCC = 4.5V and 5.5V, VIH ...

Page 5

CONFORMANCE GROUPS METHOD Group E Subgroup 2 5005 NOTE: Except FN test which will be performed 100% Go/No-Go. TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS OPEN GROUND STATIC BURN-IN I TEST CONDITIONS (Note ...

Page 6

Intersil Space Level Product Flow - ‘MS’ Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, 4 Samples/Wafer, 0 Rejects 100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method ...

Page 7

AC Timing Diagrams and Load Circuit VIH INPUT VS VIL TPLH VOH VS OUTPUT VOL TTLH VOH 80% 20% OUTPUT VOL VT+ VCC VI GND VCC VO GND HYSTERESIS DEFINITION All Intersil semiconductor products are manufactured, assembled and tested under ...

Page 8

Die Characteristics DIE DIMENSIONS mils 2.29 x 2.29mm METALLIZATION: Type: AlSi Å Å Metal Thickness: 11k 1k GLASSIVATION: Type: SiO 2 Å Å Thickness: 13k 2.6k WORST CASE CURRENT DENSITY <2 A/cm BOND ...

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