M27W256-80N6TR STMicroelectronics, M27W256-80N6TR Datasheet - Page 4

• Manufacturer Part Number: M27W256-80N6TR
• Description: 256 Kbit 32Kb x 8 Low Voltage UV EPROM and OTP EPROM
• Manufacturer: STMicroelectronics

M27W400
Table 5. AC Measurement Conditions
Figure 3. Testing Input Output Waveform
Table 6. Capacitance
Note: 1. Sampled only, not 100% tested.
The M27W400 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. In addition the Word-wide or
Byte- wide organisation must be selected.
Chip Enable (E) is the power control and should be
used for device selection. Output Enable (G) is the
output control and should be used to gate data to
the output pins independent of device selection.
Assuming that the addresses are stable, the ad-
dress access time (t
4/15
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Symbol
High Speed
Standard
C
C
2.4V
0.4V
OUT
IN
3V
0V
Input Capacitance (except BYTEV
Input Capacitance (BYTEV
Output Capacitance
AVQV
(1)
(T
) is equal to the delay
Parameter
A
= 25 °C, f = 1 MHz)
PP
)
1.5V
2.0V
0.8V
AI01822
PP
)
High Speed
0 to 3V
1.5V
Figure 4. AC Testing Load Circuit
from E to output (t
output after a delay of t
of G, assuming that E has been low and the ad-
dresses have been stable for at least t
Standby Mode
The M27W400 has a standby mode which reduc-
es the supply current from 20mA to 15µA. The
M27W400 is placed in the standby mode by apply-
ing a CMOS high signal to the E input. When in the
standby mode, the outputs are in a high imped-
ance state, independent of the G input.
10ns
Test Condition
V
V
V
OUT
C L = 30pF for High Speed
C L = 100pF for Standard
C L includes JIG capacitance
IN
IN
DEVICE
UNDER
TEST
= 0V
= 0V
= 0V
ELQV
1.3V
Min
GLQV
). Data is available at the
1N914
3.3k
0.4V to 2.4V
0.8V and 2V
C L
from the falling edge
Standard
20ns
Max
120
10
12
AVQV
OUT
AI01823B
-t
Unit
pF
pF
pF
GLQV
.