STM32F051C8T7TR STMicroelectronics, STM32F051C8T7TR Datasheet - Page 66

• Manufacturer Part Number: STM32F051C8T7TR
• Description: ARM Microcontrollers - MCU Entry-level ARM Cortex-M0 MCU 64Kb
• Manufacturer: STMicroelectronics

Specifications of STM32F051C8T7TR

• Rohs: yes

STM32F051x
6.3.11
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 46.
Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 47.
1. Data based on characterization results, not tested in production.
V
V
Symbol Parameter
Symbol
ESD(HBM)
ESD(CDM)
S
EMI
Electrostatic discharge
voltage (human body model)
Electrostatic discharge
voltage (charge device model)
Peak level
EMI characteristics
ESD absolute maximum ratings
Ratings
V
LQFP64 package
compliant with IEC
61967-2
DD
= 3.6 V, T
Conditions
Doc ID 022265 Rev 3
A
= 25 °C,
T
to JESD22-A114
T
to JESD22-C101
A
A
= +25 °C, conforming
= +25 °C, conforming
Conditions
0.1 to 30 MHz
30 to 130 MHz
130 MHz to 1GHz
SAE EMI Level
frequency band
Monitored
Class Maximum value
2
II
Max vs. [f
Electrical characteristics
8/48 MHz
28
23
-3
4
HSE
2000
500
/f
HCLK
]
(1)
dBµV
67/105
Unit
Unit
-
V