SE98TK,118 NXP Semiconductors, SE98TK,118 Datasheet - Page 8

IC TEMP SENSOR I2C 8HVSON

SE98TK,118

Manufacturer Part Number
SE98TK,118
Description
IC TEMP SENSOR I2C 8HVSON
Manufacturer
NXP Semiconductors
Datasheet

Specifications of SE98TK,118

Function
Temp Monitoring System (Sensor)
Topology
ADC (Sigma Delta), Register Bank
Sensor Type
Internal
Sensing Temperature
-40°C ~ 125°C
Output Type
I²C™/SMBus™
Output Alarm
Yes
Output Fan
Yes
Voltage - Supply
1.7 V ~ 3.6 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
8-HVSON
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
568-3347-2
935281692118
SE98TK-T
NXP Semiconductors
SE98_4
Product data sheet
7.3.2.1 Alarm window
7.3.2.2 Critical trip
7.3.2 EVENT thresholds
The device provides a comparison window with an UPPER trip point and a LOWER trip
point, programmed through the Upper Boundary Alarm Trip register (02h), and Lower
Boundary Alarm Trip register (03h). The Upper Boundary Alarm Trip register holds the
upper temperature trip point, while the Lower Boundary Alarm Trip register holds the lower
temperature trip point as modified by hysteresis as programmed in the Configuration
register. When enabled, the EVENT output triggers whenever entering or exiting (crossing
above or below) the alarm window.
The Upper Boundary Alarm Trip should always be set above the Lower Boundary Alarm
Trip.
The T
modified by hysteresis as programmed in the Configuration register. When the
temperature reaches the critical temperature value in this register (and EVENT is
enabled), the EVENT output asserts and cannot be de-asserted until the temperature
drops below the critical temperature threshold. The Event cannot be cleared through the
Clear EVENT bit or SMBus Alert.
The Critical Alarm Trip should always be set above the Upper Boundary Alarm Trip.
Advisory note:
– NXP Device: The EVENT output can be cleared through the Clear EVENT bit or
– Competitor Device: The EVENT output can be cleared only through the Clear
– Work-around: Only clear EVENT output using the EVENT bit.
– There will be no change to the NXP device.
Advisory note:
– NXP device: Requires one conversion cycle (125 ms) after setting the alarm
– Competitor devices: Compares the alarm limit with temperature register at any
– Work-around: Wait at least 125 ms before enabling EVENT output.
– SE98B will compare alarm window and temperature register immediately after
Advisory note:
– NXP device: Requires one conversion cycle (125 ms) after setting the alarm
th(crit)
SMBus Alert.
EVENT bit.
window before comparing the alarm limit with temperature register to ensure that
there is correct data in the temperature register before comparing with the Alarm
Window and operating EVENT output.
time, so they get the EVENT output immediately when new UPPER or LOWER
and Event B3 are set at the same time.
setting.
window before comparing the alarm limit with temperature register to ensure that
there is correct data in the temperature register before comparing with the Alarm
Window and operating EVENT output.
temperature setting is programmed in the Critical Alarm Trip register (04h) as
Rev. 04 — 2 February 2009
DDR memory module temp sensor, 3.3 V
© NXP B.V. 2009. All rights reserved.
SE98
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