ST72F260G1M6 STMicroelectronics, ST72F260G1M6 Datasheet - Page 168

• Manufacturer Part Number: ST72F260G1M6
• Description: MCU 8BIT 4K FLASH ICP 28SOIC
• Manufacturer: STMicroelectronics
• Series: ST7r

Specifications of ST72F260G1M6

• Core Processor: ST7
• Core Size: 8-Bit
• Speed: 16MHz
• Connectivity: SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 22
• Program Memory Size: 4KB (4K x 8)
• Program Memory Type: FLASH
• Ram Size: 256 x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 28-SOIC (7.5mm Width)
• Data Converters: A/D 6x10b
• Processor Series: ST72F2x
• Core: ST7
• Data Bus Width: 8 bit
• Data Ram Size: 256 B
• Interface Type: I2C/SCI/SPI
• Maximum Clock Frequency: 8 MHz
• Number Of Programmable I/os: 22
• Number Of Timers: 3
• Operating Supply Voltage: 2.7 V to 5.5 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Development Tools By Supplier: ST7F264-IND/USB, ST72F34X-SK/RAIS, ST7MDT10-DVP3, ST7MDT10-EMU3, STX-RLINK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 6-ch x 10-bit
• Controller Family/series: ST7
• No. Of I/o's: 22
• Ram Memory Size: 256Byte
• Cpu Speed: 8MHz
• No. Of Timers: 2
• Embedded Interface Type: I2C, SCI, SPI
• Rohs Compliant: Yes
• For Use With: 497-5046 - KIT TOOL FOR ST7/UPSD/STR7 MCU
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 497-4840

ST72260Gx, ST72262Gx, ST72264Gx
16 KNOWN LIMITATIONS
16.1 ALL FLASH AND ROM DEVICES
16.1.1 16-bit timer PWM Mode
In PWM mode, the first PWM pulse is missed after
writing the value FFFCh in the OC12R register.In
PWM mode, the first PWM pulse is missed after
writing the value FFFCh in the OC1R register
(OC1HR, OC1LR). It leads to either full or no PWM
during a period, depending on the OLVL1 and
OLVL2 settings.
16.1.2
interrupt routine
When an active interrupt request occurs at the
same time as the related flag or interrupt mask is
being cleared, the CC register may be corrupted.
Concurrent interrupt context
The symptom does not occur when the interrupts
are handled normally, i.e. when:
– The interrupt request is cleared (flag reset or in-
– The interrupt request is cleared (flag reset or in-
– The interrupt request is cleared (flag reset or in-
If these conditions are not met, the symptom can
be avoided by implementing the following se-
quence:
Perform SIM and RIM operation before and after
resetting an active interrupt request
Nested interrupt context
The symptom does not occur when the interrupts
are handled normally, i.e. when:
– The interrupt request is cleared (flag reset or in-
– The interrupt request is cleared (flag reset or in-
168/172
Ex:
terrupt mask) within its own interrupt routine
terrupt mask) within any interrupt routine
terrupt mask) in any part of the code while this in-
terrupt is disabled
terrupt mask) within its own interrupt routine
terrupt mask) within any interrupt routine with
higher or identical priority level
SIM
reset flag or interrupt mask
RIM
Clearing
active
interrupts
outside
– The interrupt request is cleared (flag reset or in-
If these conditions are not met, the symptom can
be avoided by implementing the following se-
quence:
16.1.3 I2C Multimaster
In multimaster configurations, if the ST7 I2C re-
ceives a START condition from another I2C mas-
ter after the START bit is set in the I2CCR register
and before the START condition is generated by
the ST7 I2C, it may ignore the START condition
from the other I2C master. In this case, the ST7
master will receive a NACK from the other device.
On reception of the NACK, ST7 can send a re-start
and Slave address to re-initiate communication
16.1.4 Functional EMS
The functional EMS (Electro Magnetic Susceptibil-
ity) severity level/behaviour class is 2B as defined
in application note AN1709.
Special care should be taken when designing the
PCB layout and firmware (refer to application
notes AN898, AN901 and AN1015) in sensitive
applications (that use switches for instance). For
more information refer to application note AN1637.
16.2 FLASH DEVICES ONLY
16.2.1 Execution of BTJX instruction
When testing the address $FF with the "BTJT" or
"BTJF" instructions, the CPU may perform an in-
correct operation when the relative jump is nega-
tive and performs an address page change.
To avoid this issue, including when using a C com-
piler, it is recommended to never use address
$00FF as a variable (using the linker parameter for
example).
terrupt mask) in any part of the code while this in-
terrupt is disabled
PUSH CC
SIM
reset flag or interrupt mask
POP CC
1