MC9S12E256MFUE Freescale Semiconductor, MC9S12E256MFUE Datasheet - Page 504

• Manufacturer Part Number: MC9S12E256MFUE
• Description: IC MCU 256K FLASH 25MHZ 80-QFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12E256MFUE

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 25MHz
• Connectivity: EBI/EMI, I²C, SCI, SPI
• Peripherals: POR, PWM, WDT
• Number Of I /o: 60
• Program Memory Size: 256KB (256K x 8)
• Program Memory Type: FLASH
• Ram Size: 16K x 8
• Voltage - Supply (vcc/vdd): 2.35 V ~ 2.75 V
• Data Converters: A/D 16x10b; D/A 2x8b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 80-QFP
• Processor Series: S12E
• Core: HCS12
• Data Bus Width: 16 bit
• Data Ram Size: 16 KB
• Interface Type: I2C/SCI/SPI
• Maximum Clock Frequency: 50 MHz
• Number Of Programmable I/os: 60
• Number Of Timers: 12
• Operating Supply Voltage: 0 V to 5 V
• Maximum Operating Temperature: + 125 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWHCS12
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 16-ch x 10-bit
• On-chip Dac: 2-ch x 8-bit
• Controller Family/series: HCS12/S12X
• No. Of I/o's: 60
• Ram Memory Size: 16KB
• Cpu Speed: 25MHz
• No. Of Timers: 3
• Embedded Interface Type: I2C, SCI, SPI
• Rohs Compliant: Yes
• For Use With: M68EVB912E128 - BOARD EVAL FOR MC9S12E128/64
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Chapter 17 Interrupt (INTV1)
17.3.2.1
Read: See individual bit descriptions
Write: See individual bit descriptions
504
ADR[3:0]
WRTINT
Reset
Field
3:0
4
W
R
Write to the Interrupt Test Registers
Read: anytime
Write: only in special modes and with I-bit mask and X-bit mask set.
0 Disables writes to the test registers; reads of the test registers will return the state of the interrupt inputs.
1 Disconnect the interrupt inputs from the priority decoder and use the values written into the ITEST registers
Note: Any interrupts which are pending at the time that WRTINT is set will remain until they are overwritten.
Test Register Select Bits
Read: anytime
Write: anytime
These bits determine which test register is selected on a read or write. The hexadecimal value written here will
be the same as the upper nibble of the lower byte of the vector selects. That is, an “F” written into ADR[3:0] will
select vectors 0xFFFE–0xFFF0 while a “7” written to ADR[3:0] will select vectors 0xFF7E–0xFF70.
Interrupt Test Control Register
0
0
7
instead.
= Unimplemented or Reserved
0
0
6
Figure 17-3. Interrupt Test Control Register (ITCR)
Table 17-2. ITCR Field Descriptions
MC9S12E256 Data Sheet, Rev. 1.08
0
0
5
WRTINT
0
4
Description
ADR3
3
1
ADR2
1
2
Freescale Semiconductor
ADR1
1
1
ADR0
1
0