AT90CAN128-16MJ Atmel, AT90CAN128-16MJ Datasheet - Page 293
![IC MCU AVR FLASH 128K 64-QFN](/photos/12/13/121326/313-64-qfn_sml.jpg)
AT90CAN128-16MJ
Manufacturer Part Number
AT90CAN128-16MJ
Description
IC MCU AVR FLASH 128K 64-QFN
Manufacturer
Atmel
Series
AVR® 90CANr
Specifications of AT90CAN128-16MJ
Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
CAN, EBI/EMI, I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
53
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-VQFN Exposed Pad, 64-HVQFN, 64-SQFN, 64-DHVQFN
For Use With
ATDVK90CAN1 - KIT DEV FOR AT90CAN128 MCU
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
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22. JTAG Interface and On-chip Debug System
22.1
22.2
22.3
7679H–CAN–08/08
Features
Overview
Test Access Port – TAP
•
•
•
•
•
•
The AVR IEEE std. 1149.1 compliant JTAG interface can be used for:
A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
Programming Overview” on page 352
respectively. The On-chip Debug support is considered being private JTAG instructions, and dis-
tributed within ATMEL and to selected third party vendors only.
Figure 22-1
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI – input and TDO – output. The Instruction Register holds JTAG
instructions controlling the behavior of a Data Register.
The ID-Register (IDentifier Register), Bypass Register, and the Boundary-scan Chain are the
Data Registers used for board-level testing. The JTAG Programming Interface (actually consist-
ing of several physical and virtual Data Registers) is used for serial programming via the JTAG
interface. The Internal Scan Chain and Break Point Scan Chain are used for On-chip debugging
only.
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
• Testing PCBs by using the JTAG Boundary-scan capability
• Programming the non-volatile memories, Fuses and Lock bits
• On-chip debugging
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
Extensive On-chip Debug Support for Break Conditions, Including
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
machine.
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Break Points on Single Address or Address Range
– Data Memory Break Points on Single Address or Address Range
shows a block diagram of the JTAG interface and the On-chip Debug system. The
and
“Boundary-scan IEEE 1149.1 (JTAG)” on page
®
AT90CAN32/64/128
“JTAG
300,
293
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