ADUC7034BCPZ-RL Analog Devices Inc, ADUC7034BCPZ-RL Datasheet - Page 9

• Manufacturer Part Number: ADUC7034BCPZ-RL
• Description: IC,Battery Management,LLCC,48PIN,PLASTIC
• Manufacturer: Analog Devices Inc
• Series: MicroConverter® ADuC7xxxr

Specifications of ADUC7034BCPZ-RL

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 20.48MHz
• Connectivity: LIN, SPI, UART/USART
• Peripherals: POR, PSM, Temp Sensor, WDT
• Number Of I /o: 9
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 3.5 V ~ 18 V
• Data Converters: A/D 2x16b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 115°C
• Package / Case: 48-LFCSP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Parameter
POWER REQUIREMENTS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
These numbers are not production tested, but are guaranteed by design and/or characterization data at production release.
Valid for a current channel ADC PGA setting of 4 to 64.
These numbers include temperature drift.
Tested at a gain range of 4; self-offset calibration removes this error.
Measured with an internal short after an initial offset calibration.
Measured with an internal short.
These numbers include internal reference temperature drift.
Factory calibrated at a gain of 1.
System calibration at a specific gain range (and temperature) removes the error at this gain range (and temperature).
Includes an initial system calibration.
Using ADC normal mode voltage reference.
Typical noise in low power modes is measured with chop enabled.
Voltage channel specifications include resistive attenuator input stage.
System calibration removes this error at the specified temperature.
RMS noise is referred to the voltage attenuator input (for example, at f
Valid after an initial self-calibration.
In ADC low power mode, the input range is fixed at ±9.375 mV. In ADC low power plus mode, the input range is fixed at ±2.34375 mV.
It is possible to extend the ADC input range by up to 10% by modifying the factory-set value of the gain calibration register or by using system calibration. Extending
the ADC input range can also be used to reduce the ADC input range (LSB size).
Limited by minimum/maximum absolute input voltage range.
Valid for a differential input less than 10 mV.
Measured using the box method.
The long-term stability specification is noncumulative. The drift in subsequent 1000 hour periods is significantly lower than in the first 1000 hour period.
References of up to REG_AVDD can be accommodated for by enabling an internal divide-by-2.
Die temperature.
Endurance is qualified to 10,000 cycles as per JEDEC Std. 22 Method A117 and measured at −40°C, +25°C, and +125°C. Typical endurance at 25°C is 170,000 cycles.
Retention lifetime equivalent at a junction temperature (T
Low power oscillator can be calibrated against either the precision oscillator or the external 32.768 kHz crystal in user code.
These numbers are not production tested, but are supported by LIN compliance testing.
BSD electrical specifications, except high and low voltage levels, are per LIN 2.0 with pull-up resistor disabled and C
This specification does not apply directly to the WU pin but includes an R
In response to a thermal shutdown event, the MCU core is not shut down but is interrupted, and the high voltage I/O pins are disabled.
Thermal impedance can be used to calculate the thermal gradient from ambient to die temperature.
Internal regulated supply available at REG_DVDD (I
The specification listed is typical; additional supply current consumed during Flash/EE memory program and erase cycles is 7 mA and 5 mA, respectively.
to yield these input-referred noise figures.
Power Supply Voltages
Power Consumption
VDD (Battery Supply)
REG_DVDD, REG_AVDD
I
I
I
I
I
I
DD
DD
DD
DD
DD
DD
(Voltage/Temperature ADC)
(MCU Normal Mode)
(MCU Powered Down)
(MCU Powered Down)
(Current ADC)
(Precision Oscillator)
33
34
1
Test Conditions/Comments
MCU clock rate = 10.24 MHz, ADC off
MCU clock rate = 20.48 MHz, ADC off
ADC low power mode, measured over the
range of T
conversion
ADC low power mode, measured over the
range of T
conversion
ADC low power plus mode, measured over an
ambient temperature range of T
+40°C, continuous ADC conversion
Average current, measured with wake-up and
watchdog timer clocked from the low power
oscillator, T
Average current, measured with wake-up and
watchdog timer clocked from low power
oscillator over a range of T
SOURCE
A
A
= 5 mA) and REG_AVDD (I
A
= −10°C to +40°C, continuous ADC
= −40°C to +85°C, continuous ADC
J
= −40°C to +85°C
) of 85°C as per JEDEC Std. 22 Method A117. Retention lifetime derates with junction temperature.
ADC
= 1 kHz, typical rms noise at the ADC input is 7.5 μV) and scaled by the attenuator (divide-by-24)
Rev. B | Page 9 of 136
LIMIT
A
= −10°C to +40°C
of 39 Ω on the wake-up line.
A
SOURCE
= −10°C to
= 1 mA).
Min
3.5
2.5
Load
= 10 nF maximum.
Typ
2.6
10
20
300
300
520
120
120
1.7
0.5
400
Max
18
2.7
20
400
500
700
300
175
ADuC7034
Unit
V
V
mA
mA
μA
μA
μA
μA
μA
mA
mA
μA