QT2032-EKG-1A2 Applied Micro Circuits Corporation, QT2032-EKG-1A2 Datasheet - Page 42

• Manufacturer Part Number: QT2032-EKG-1A2
• Manufacturer: Applied Micro Circuits Corporation

Specifications of QT2032-EKG-1A2

• Lead Free Status / RoHS Status: Supplier Unconfirmed

QT2022/32 - Data Sheet: DS3051
7.2.3 LOF Defect Generation
An LOF defect occurs when a Severely Errored Frame (SEF) persists for a period of 3 ms. The LOF defect is termi-
nated when no SEF defects are detected for a period T, where 1 ms <= T <= 3 ms.
7.2.4 LOS Defect Generation
An LOS defect occurs upon detection of no transitions on the incoming signal for time T, where T = 41.6667 μ s
(three row periods). An LOS defect is terminated after a time period equal to the greater of 125 μ s or 2.5 T contain-
ing no transition-free intervals of length T, where T = three row periods.
Note: If no signal is applied to the fiber input, the WIS Synchronization process loses SYNC before the LOS, or
LOF alarms are raised. Since the WIS suspends normal processes when there is a loss of WIS Sync, the LOS and
LOF alarms will be masked. The WIS Synchronization alarm can be treated as an effective replacement for the
LOS/LOF alarms.
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