AT32UC3B0256 Atmel Corporation, AT32UC3B0256 Datasheet - Page 594

• Manufacturer Part Number: AT32UC3B0256
• Manufacturer: Atmel Corporation

Specifications of AT32UC3B0256

• Flash (kbytes): 256 Kbytes
• Pin Count: 64
• Max. Operating Frequency: 60 MHz
• Cpu: 32-bit AVR
• # Of Touch Channels: 32
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 44
• Ext Interrupts: 44
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device + OTG
• Spi: 4
• Twi (i2c): 1
• Uart: 3
• Ssc: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.0-3.6 or (1.65-1.95+3.0-3.6)
• Operating Voltage (vcc): 3.0-3.6 or (1.65-1.95+3.0-3.6)
• Fpu: No
• Mpu / Mmu: Yes / No
• Timers: 10
• Output Compare Channels: 16
• Input Capture Channels: 6
• Pwm Channels: 13
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

27.5.2.4
27.5.2.5
32059L–AVR32–01/2012
INTEST
CLAMP
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
Table 27-13. INTEST Details
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic
10. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
inputs.
inputs.
Details
00100 (0x04)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
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