AT32UC3B0512AU Atmel Corporation, AT32UC3B0512AU Datasheet - Page 593
AT32UC3B0512AU
Manufacturer Part Number
AT32UC3B0512AU
Description
Manufacturer
Atmel Corporation
Datasheets
1.AT32UC3A0128.pdf
(377 pages)
2.AT32UC3A0128.pdf
(33 pages)
3.AT32UC3A0128.pdf
(159 pages)
4.AT32UC3A0128AU.pdf
(2 pages)
5.AT32UC3B0128.pdf
(684 pages)
6.AT32UC3B0128.pdf
(107 pages)
Specifications of AT32UC3B0512AU
Flash (kbytes)
512 Kbytes
Pin Count
64
Max. Operating Frequency
60 MHz
Cpu
32-bit AVR
# Of Touch Channels
32
Hardware Qtouch Acquisition
No
Max I/o Pins
44
Ext Interrupts
44
Usb Transceiver
1
Usb Speed
Full Speed
Usb Interface
Device + OTG
Spi
4
Twi (i2c)
1
Uart
3
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
16
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
96
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
3.0-3.6 or (1.65-1.95+3.0-3.6)
Operating Voltage (vcc)
3.0-3.6 or (1.65-1.95+3.0-3.6)
Fpu
No
Mpu / Mmu
Yes / No
Timers
10
Output Compare Channels
16
Input Capture Channels
6
Pwm Channels
13
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT32UC3B0512AU-Z2U
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
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27.5.2.3
32059L–AVR32–01/2012
EXTEST
Table 27-11. SAMPLE_PRELOAD Details
This instruction selects the boundary-scan chain as Data Register for testing circuitry external to
the 32-bit AVR package. The contents of the latched outputs of the boundary-scan chain is
driven out as soon as the JTAG IR-register is loaded with the EXTEST instruction.
Starting in Run-Test/Idle, the EXTEST instruction is accessed the following way:
Table 27-12. EXTEST Details
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The Data on the external pins are sampled into the boundary-scan
7. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the external pins is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the scan chain is applied to the output pins.
10. Return to Run-Test/Idle.
chain.
Details
00010 (0x02)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Details
00011 (0x03)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
593
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