adc1210s125hn/c1 NXP Semiconductors, adc1210s125hn/c1 Datasheet - Page 30

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adc1210s125hn/c1

Manufacturer Part Number
adc1210s125hn/c1
Description
Single 12-bit Adc; 65 Msps, 80 Msps, 105 Msps Or 125 Msps; Cmos Or Lvds Ddr Digital Outputs
Manufacturer
NXP Semiconductors
Datasheet
NXP Semiconductors
Table 28.
Table 29.
Table 30.
ADC1210S_SER_1
Preliminary data sheet
Bit
7 to 4
3 to 0
Bit
7 to 4
3
2 to 0
Bit
7 to 4
3 to 2
1 to 0
Symbol
-
FASTOTR
FASTOTR_DET[2:0]
Symbol
-
DAV_DRV[1:0]
DATA_DRV[1:0]
Symbol
TESTPAT_USER[3:0]
-
Test pattern register 3 (address 0016h) bit description
Fast OTR register (address 0017h) bit description
CMOS output register (address 0020h) bit description
Access
R/W
R/W
Access
R/W
R/W
Access
R/W
All information provided in this document is subject to legal disclaimers.
Value
0000
00
01
10
11
00
01
10
11
Value
0000
0
1
000
001
010
011
100
101
110
111
Rev. 01 — 9 April 2010
Value
0000
0000
Description
not used
drive strength for DAV CMOS output buffer
drive strength for DATA CMOS output buffer
ADC1210S series; CMOS or LVDS DDR digital outputs
low
medium
high
very high
low
medium
high
very high
Description
not used
fast Out-of-Range (OTR) detection
set fast OTR detect level
−20.56 dB
−16.12 dB
−11.02 dB
−7.82 dB
−5.49 dB
−3.66 dB
−2.14 dB
−0.86 dB
not used
Description
custom digital test pattern (bits 3 to 0)
disabled
enabled
ADC1210S series
© NXP B.V. 2010. All rights reserved.
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