M29W800AB STMICROELECTRONICS [STMicroelectronics], M29W800AB Datasheet - Page 13

• Manufacturer Part Number: M29W800AB
• Description: 8 Mbit 1Mb x8 or 512Kb x16, Boot Block Low Voltage Single Supply Flash Memory
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

Table 12. AC Measurement Conditions
Figure 5. AC Testing Input Output Waveform
Table 13. Capacitance
Note: Sampled only, not 100% tested.
Table 14. DC Characteristics
(T
Note: 1. Sampled only, not 100% tested.
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Symbol
V
I
CC4
A
LKO
I
I
I
V
V
I
CC1
CC2
CC3
V
V
V
I
I
LO
= 0 to 70 C, –20 to 85 C or –40 to 85 C; V
OH
ID
LI
OL
Symbol
IH
ID
IL
C
(1)
3V
0V
(1)
C
OUT
IN
Input Leakage Current
Output Leakage Current
Supply Current (Read by Word)
Supply Current (Read by Word)
Supply Current (Stan-by)
Supply Current
(Program or Erase)
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage CMOS
A9 Voltage (Electronic Signature)
A9 Current (Electronic Signature)
Supply Voltage (Erase and
Program lock-out)
Input Capacitance
Output Capacitance
Parameter
Parameter
(1)
(T
A
= 25 C, f = 1 MHz)
0 to 3V
E = V
E = V
1.5V
AI01417
1.5V
10ns
Byte program, Block or
Chip Erase in progress
0V
Test Condition
0V
IL
IL
E = V
Test Condition
CC
I
OH
, G = V
I
, G = V
OL
V
A9 = V
V
V
OUT
= 2.7V to 3.6V)
= –100 A
V
= 1.8mA
IN
OUT
CC
IN
= 0V
IH
IL
= 0V
Figure 6. AC Testing Load Circuit
ID
, f = 6MHz
0.2V
, f = 6MHz
V
V
CC
CC
C L includes JIG capacitance
DEVICE
UNDER
TEST
V
0.7 V
CC
–0.5
11.5
Min
2.0
–0.4V
Min
CC
M29W800AT, M29W800AB
0.8V
Typ.
4.5
30
30
3
1N914
3.3k
C L = 30pF or 100pF
Max
12
6
V
CC
Max
0.45
12.5
100
100
0.8
2.3
10
10
20
+ 0.3
1
1
OUT
AI01968
Unit
pF
pF
Unit
13/33
mA
mA
mA
V
V
V
V
V
V
A
A
A
A