STM8S105C4B3 STMICROELECTRONICS [STMicroelectronics], STM8S105C4B3 Datasheet - Page 104

• Manufacturer Part Number: STM8S105C4B3
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

Electrical characteristics
10.3.12.4
10.3.12.5
10.3.12.6
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Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the product
is stressed in order to determine its performance in terms of electrical sensitivity. For more
details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are applied
to the pins of each sample according to each pin combination. The sample size depends on
the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the
JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.
Static latch-up
Two complementary static tests are required on 10 parts to assess the latch-up performance:
•
•
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Symbol
Symbol
V
V
(1)
LU
ESD(HBM)
ESD(CDM)
A supply overvoltage (applied to each power supply pin)
A current injection (applied to each input, output and configurable I/O pin) are performed
on each sample.
Data based on characterization results, not tested in production
Parameter
Static latch-up class
Ratings
Electrostatic discharge
voltage (Human body model)
Electrostatic discharge
voltage (Charge device
model)
Table 50: ESD absolute maximum ratings
Table 51: Electrical sensitivities
DocID14771 Rev 9
Conditions
T
T
T
A
A
A
= +25 °C
= +85 °C
= +125 °C
Conditions
T
conforming to
JESD22-A114
T
to JESD22-C101
A
A
=+25°C, conforming
= +25°C,
Class
A
IV
Maximum
value
2000
1000
Class
A
A
A
STM8S105xx
(1)
(1)
Unit
V
V