AM29LV642D AMD [Advanced Micro Devices], AM29LV642D Datasheet - Page 40

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AM29LV642D

Manufacturer Part Number
AM29LV642D
Description
Manufacturer
AMD [Advanced Micro Devices]
Datasheet

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TEST CONDITIONS
Note: Diodes are IN3064 or equivalent
Note: If V
KEY TO SWITCHING WAVEFORMS
38
Device
Under
Test
3.0 V
0.0 V
WAVEFORM
IO
< V
CC
Figure 11.
, the input measurement reference level is 0.5 V
Input
C
L
Figure 12. Input Waveforms and Measurement Levels
Test Setup
Don’t Care, Any Change Permitted
1.5 V
6.2 kΩ
Does Not Apply
3.3 V
INPUTS
D A T A
2.7 kΩ
Am29LV642D
Measurement Level
S H E E T
IO
Note: If V
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement
reference levels (See Note)
Output timing measurement
reference levels
Changing from H to L
Changing from L to H
.
Test Condition
Steady
Center Line is High Impedance State (High Z)
IO
< V
Table 12. Test Specifications
CC
, the reference level is 0.5 V
Changing, State Unknown
OUTPUTS
L
0.5 V
90R
30
IO
0.0–3.0
0.5 V
V
25022A2 May 5, 2006
1 TTL gate
1.5
5
IO
Output
12R
100
IO
.
Unit
pF
ns
V
V
V

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