EVAL-ADUC812QS Analog Devices Inc, EVAL-ADUC812QS Datasheet - Page 5

• Manufacturer Part Number: EVAL-ADUC812QS
• Description: KIT DEV FOR ADUC812 QUICK START
• Manufacturer: Analog Devices Inc
• Series: QuickStart™ Kitr
• Type: MCUr

Specifications of EVAL-ADUC812QS

• Rohs Status: RoHS non-compliant
• Contents: Evaluation Board, Power Supply, Cable, Software and Documentation
• For Use With/related Products: ADuC812

Parameter
DIGITAL OUTPUTS
POWER REQUIREMENTS
NOTES
10
11
12
13
14
15
16
17
18
Typical specifications are not production tested, but are supported by characterization data at initial product release.
Timing Specifications—See Pages 46–55.
Specifications subject to change without notice.
Please refer to User Guide, Quick Reference Guide, Application Notes, and Silicon Errata Sheet at www.analog.com/microconverter for additional information.
REV. E
1
2
3
4
5
6
7
8
9
Specifications apply after calibration.
Temperature range –40°C to +85°C.
Linearity is guaranteed during normal MicroConverter core operation.
Linearity may degrade when programming or erasing the 640 byte Flash/EE space during ADC conversion times due to on-chip charge pump activity.
Measured in production at V
User may need to execute Software Calibration Routine to achieve these specifications, which are configuration dependent.
The offset and gain calibration spans are defined as the voltage range of user system offset and gain errors that the ADuC812 can compensate.
SNR calculation includes distortion and noise components.
Specification is not production tested, but is supported by characterization data at initial product release.
The temperature sensor will give a measure of the die temperature directly; air temperature can be inferred from this result.
DAC linearity is calculated using:
Flash/EE Memory Performance Specifications are qualified as per JEDEC Specification (Data Retention) and JEDEC Draft Specification A117 (Endurance).
Endurance Cycling is evaluated under the following conditions:
I
I
I
Analog I
EA = Port0 = DV
Reduced code range of 48 to 4095, 0 to V
Reduced code range of 48 to 3995, 0 to V
DAC output load = 10 kΩ and 50 pF.
Mode
Cycle Pattern
Erase Time
Program Time
Normal Mode (V
Normal Mode (V
Idle Mode (V
Idle Mode (V
where MCLKIN is the oscillator frequency in MHz and resultant I
DD
DD
DD
Output High Voltage (V
Output Low Voltage (V
Floating State Leakage Current
Floating State Output Capacitance
I
I
I
DD
DD
DD
ALE, PSEN, Ports 0 and 2
Port 3
at other MCLKIN frequencies is typically given by:
currents are expressed as a summation of analog and digital power supply currents during normal MicroConverter operation.
is not measured during Flash/EE program or erase cycles; I
Normal Mode
Idle Mode
Power-Down Mode
DD
= 2 mA (typ) in normal operation (internal V
DD
DD
= 5 V):
= 3 V):
DD
DD
DD
, XTAL1 (Input) tied to DV
= 5 V):
= 3 V):
= Byte Programming, Page Erase Cycling
= 00H to FFH
= 20 ms
= 100 µs
17
DD
OL
18
OH
= 5 V after Software Calibration Routine at 25°C only.
I
I
I
I
DD
DD
DD
DD
)
)
14, 15, 16
= (1.6 nAs × MCLKIN) + 6 mA
= (0.8 nAs × MCLKIN) + 3 mA
= (0.75 nAs × MCLKIN) + 6 mA
= (0.25 nAs × MCLKIN) + 3 mA
REF
DD
range
range
DD
, during this measurement.
V
2.4
4.0
0.4
0.2
0.4
0.2
±10
±1
10
43
32
26
8
25
18
15
7
30
5
REF
DD
, ADC, and DAC peripherals powered on).
= 5 V
DD
ADuC812BS
will typically increase by 10 mA during these cycles.
DD
values are in mA.
V
2.4
2.6
0.4
0.2
0.4
0.2
±10
±1
10
25
16
12
3
10
6
6
2
15
5
DD
–5–
= 3 V
Unit
V min
V typ
V max
V typ
V max
V typ
µA max
µA typ
pF typ
mA max
mA typ
mA typ
mA typ
mA max
mA typ
mA typ
mA typ
µA max
µA typ
Test Conditions/Comments
V
I
V
I
I
I
I
I
MCLKIN = 16 MHz
MCLKIN = 16 MHz
MCLKIN = 12 MHz
MCLKIN = 1 MHz
MCLKIN = 16 MHz
MCLKIN = 16 MHz
MCLKIN = 12 MHz
MCLKIN = 1 MHz
SOURCE
SOURCE
SINK
SINK
SINK
SINK
DD
DD
= 4.5 V to 5.5 V
= 2.7 V to 3.3 V
= 1.6 mA
= 1.6 mA
= 8 mA
= 8 mA
= 80 µA
= 20 µA
ADuC812