MC9S12DT256MPVE Freescale Semiconductor, MC9S12DT256MPVE Datasheet - Page 1105

IC MCU 256K FLASH 25MHZ 112-LQFP

MC9S12DT256MPVE

Manufacturer Part Number
MC9S12DT256MPVE
Description
IC MCU 256K FLASH 25MHZ 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheet

Specifications of MC9S12DT256MPVE

Core Processor
HCS12
Core Size
16-Bit
Speed
25MHz
Connectivity
CAN, I²C, SCI, SPI
Peripherals
PWM, WDT
Number Of I /o
91
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
12K x 8
Voltage - Supply (vcc/vdd)
2.35 V ~ 5.25 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
112-LQFP
Processor Series
S12D
Core
HCS12
Data Bus Width
16 bit
Data Ram Size
12 KB
Interface Type
CAN/I2C/SCI/SPI
Maximum Clock Frequency
25 MHz
Number Of Programmable I/os
91
Number Of Timers
1
Operating Supply Voltage
5 V to 2.5 V
Maximum Operating Temperature
+ 125 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWHCS12
Development Tools By Supplier
M68KIT912DP256
Minimum Operating Temperature
- 40 C
On-chip Adc
2 (8-ch x 10-bit)
No. Of I/o's
91
Eeprom Memory Size
4KB
Ram Memory Size
12KB
Cpu Speed
25MHz
No. Of Timers
1
No. Of Pwm Channels
8
Digital Ic Case Style
LQFP
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Chapter 27
512 Kbyte Flash Module (S12XFTX512K4V2)
27.1
This document describes the FTX512K4 module that includes a 512K Kbyte Flash (nonvolatile) memory.
The Flash memory may be read as either bytes, aligned words or misaligned words. Read access time is
one bus cycle for bytes and aligned words, and two bus cycles for misaligned words.
The Flash memory is ideal for program and data storage for single-supply applications allowing for field
reprogramming without requiring external voltage sources for program or erase. Program and erase
functions are controlled by a command driven interface. The Flash module supports both block erase and
sector erase. An erased bit reads 1 and a programmed bit reads 0. The high voltage required to program
and erase the Flash memory is generated internally. It is not possible to read from a Flash block while it is
being erased or programmed.
27.1.1
Command Write Sequence — A three-step MCU instruction sequence to execute built-in algorithms
(including program and erase) on the Flash memory.
Multiple-Input Signature Register (MISR) — A Multiple-Input Signature Register is an output
response analyzer implemented using a linear feedback shift-register (LFSR). A 16-bit MISR is used to
compress data and generate a signature that is particular to the data read from a Flash block.
27.1.2
Freescale Semiconductor
512 Kbytes of Flash memory comprised of four 128 Kbyte blocks with each block divided into
128 sectors of 1024 bytes
Automated program and erase algorithm
Interrupts on Flash command completion, command buffer empty
Fast sector erase and word program operation
2-stage command pipeline for faster multi-word program times
Sector erase abort feature for critical interrupt response
Flexible protection scheme to prevent accidental program or erase
Single power supply for all Flash operations including program and erase
Introduction
Glossary
Features
A Flash word must be in the erased state before being programmed.
Cumulative programming of bits within a Flash word is not allowed.
MC9S12XDP512 Data Sheet, Rev. 2.21
CAUTION
1107

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