MC9S12DG256BVPV Freescale Semiconductor, MC9S12DG256BVPV Datasheet - Page 103

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MC9S12DG256BVPV

Manufacturer Part Number
MC9S12DG256BVPV
Description
IC MCU 256K FLASH 25MHZ 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS12r
Datasheet

Specifications of MC9S12DG256BVPV

Core Processor
HCS12
Core Size
16-Bit
Speed
25MHz
Connectivity
CAN, I²C, SCI, SPI
Peripherals
PWM, WDT
Number Of I /o
91
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
12K x 8
Voltage - Supply (vcc/vdd)
2.35 V ~ 5.25 V
Data Converters
A/D 16x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
112-LQFP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

Available stocks

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Quantity
Price
Part Number:
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Part Number:
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Manufacturer:
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A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
3. Maximum Erase and Programming times are achieved under particular combinations of f
4. urst Programming operations are not applicable to EEPROM
5. Minimum Erase times are achieved under maximum NVM operating frequency f
6. Minimum time, if first word in the array is not blank
7. Maximum time to complete check on an erased block
Refer to formulae in Sections A.3.1.1 - A.3.1.4 for guidance.
NOTE:
NOTE:
NOTE:
Conditions are shown in Table A-4 unless otherwise noted
Num C
1
2
All values shown in Table A-12 are target values and subject to further extensive
characterization.
Flash cycling performance is 10 cycles at -40C to + 125C. Data retention is
specified for 15 years.
EEPROM cycling performance is 10K cycles at -40C to +125C. Data retention is
specified for 5 years on words after cycling 10K times. However if only 10 cycles
are executed on a word the data retention is specified for 15 years.
C Flash/EEPROM (-40C to + 125C)
C EEPROM (-40C to + 125C)
Table A-12 NVM Reliability Characteristics
Freescale Semiconductor, Inc.
For More Information On This Product,
Rating
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MC9S12DP256B Device User Guide — V02.14
Cycles
10,000
10
NVMOP
.
Retention
NVMOP
Lifetime
Data
15
5
and bus frequency f
Years
Years
Unit
bus
.
103

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