MAX1181ECM+D Maxim Integrated Products, MAX1181ECM+D Datasheet - Page 16

• Manufacturer Part Number: MAX1181ECM+D
• Description: IC ADC 10BIT 80MSPS DUAL 48-TQFP
• Manufacturer: Maxim Integrated Products

Specifications of MAX1181ECM+D

• Number Of Bits: 10
• Sampling Rate (per Second): 80M
• Data Interface: Parallel
• Number Of Converters: 2
• Power Dissipation (max): 291mW
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 48-TQFP Exposed Pad, 48-eTQFP, 48-HTQFP, 48-VQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Dual 10-Bit, 80Msps, 3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Figure 6. Transformer-Coupled Input Drive
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the endpoints of the transfer function, once
offset and gain errors have been nullified. The static lin-
earity parameters for the MAX1181 are measured using
the best straight-line fit method.
Differential nonlinearity is the difference between an
actual step-width and the ideal value of 1LSB. A DNL
error specification of less than 1LSB guarantees no
missing codes and a monotonic transfer function.
16
V
V
IN
IN
______________________________________________________________________________________
0.1μF
0.1μF
N.C.
N.C.
Static Parameter Definitions
MINI-CIRCUITS
MINI-CIRCUITS
3
3
1
1
2
2
TT1–6
TT1–6
T1
T1
Differential Nonlinearity (DNL)
6
5
4
6
5
4
2.2μF
2.2μF
Integral Nonlinearity (INL)
25Ω
25Ω
25Ω
25Ω
0.1μF
0.1μF
22pF
22pF
22pF
22pF
INA+
COM
INA-
INB+
INB-
MAX1181
Figure 9 depicts the aperture jitter (t
sample-to-sample variation in the aperture delay.
Aperture delay (t
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 9).
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error).
The ideal, theoretical minimum analog-to-digital noise is
caused by quantization error only and results directly
from the ADC’s resolution (N-Bits):
In reality, there are other noise sources besides quanti-
zation noise; thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise, which includes all spectral
components minus the fundamental, the first five har-
monics, and the DC offset.
SINAD is computed by taking the ratio of the RMS sig-
nal to all spectral components minus the fundamental
and the DC offset.
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB
is computed from:
THD is typically the ratio of the RMS sum of the first four
harmonics of the input signal to the fundamental itself.
This is expressed as:
THD
Signal-to-Noise Plus Distortion (SINAD)
Dynamic Parameter Definitions
=
20
Effective Number of Bits (ENOB)
SNR
Total Harmonic Distortion (THD)
×
ENOB
log
AD
[max]
10
Signal-to-Noise Ratio (SNR)
) is the time defined between the
=
⎛
⎜
⎜ ⎜
⎝
= 6.02
SINAD
V
2
6 02
2
.
+
✕
−1 76
V
N + 1.76
3
.
2
V
Aperture Delay
Aperture Jitter
1
+
V
AJ
4
), which is the
2
+
V
5
2
⎞
⎟
⎟ ⎟
⎠