STM32F101C8

Manufacturer Part NumberSTM32F101C8
DescriptionMainstream Access line, ARM Cortex-M3 MCU with 64 Kbytes Flash, 36 MHz CPU
ManufacturerSTMicroelectronics
STM32F101C8 datasheet
 

Specifications of STM32F101C8

Peripherals Supportedtimers, ADC, SPIs, I2Cs and USARTsConversion Range0 to 3.6 V
Systick Timer24-bit downcounter  
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Page 52/87

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Electrical characteristics
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device is monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC61967-2 standard which specifies the test board and the pin loading.
Table 30.
EMI characteristics
Symbol Parameter
S
Peak level
EMI
5.3.11
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 31.
ESD absolute maximum ratings
Symbol
Electrostatic discharge
V
ESD(HBM)
voltage (human body model)
Electrostatic discharge
V
ESD(CDM)
voltage (charge device model)
1. Based on characterization results, not tested in production.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78 IC latch-up standard.
Table 32.
Electrical sensitivities
Symbol
LU
Static latch-up class
52/87
Conditions
frequency band
0.1 MHz to 30 MHz
= 3.3 V, T
= 25 °C,
V
DD
A
30 MHz to 130 MHz
LQFP100 package
compliant with
130 MHz to 1GHz
IEC 61967-2
SAE EMI Level
Ratings
= +25 °C
T
A
conforming to JESD22-A114
= +25 °C
T
A
conforming to JESD22-C101
Parameter
= +85 °C conforming to JESD78A
T
A
Doc ID 13586 Rev 14
STM32F101x8, STM32F101xB
Max vs. [f
/f
HSE
HCLK
Monitored
8/36 MHz
7
8
13
3.5
Maximum
Conditions
Class
value
2
2000
II
Conditions
]
Unit
dBµV
-
Unit
(1)
V
500
Class
II level A