ST72344S4 STMicroelectronics, ST72344S4 Datasheet - Page 214

• Manufacturer Part Number: ST72344S4
• Description: 8-bit MCU
• Manufacturer: STMicroelectronics

Specifications of ST72344S4

• Up To 16 Kbytes Program Memory: single voltage extended Flash (XFlash) with readout and write protection, in-circuit and inapplication programming (ICP and IAP). 10K write/erase cycles guaranteed, data retention
• 256 Bytes Data Eeprom With Readout Protection. 300k Write/erase Cycles Guaranteed, Data Retention: 20 years at 55 °C.
• Clock Sources: crystal/ceramic resonator oscillators, high-accuracy internal RC oscillator or external clock
• 5 Power-saving Modes: Slow, Wait, Halt, Auto-wakeup from Halt and Active-halt
• 16-bit Timer A With: 1 input capture, 1 output compares, external clock input, PWM and pulse generator modes
• 16-bit Timer B With: 2 input captures, 2 output compares, PWM and pulse generator modes

Electrical characteristics
13.8.2
13.8.3
214/247
EMI (electromagnetic interference)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 104. EMI emissions
1. Data based on characterization results, not tested in production.
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Human body
model can be simulated. This test conforms to the JESD22-A114A/A115A standard.
Table 105. ESD absolute maximum ratings
1. Data based on characterization results, not tested in production.
Static latch-up (LU)
Two complementary static tests are required on 6 parts to assess the latch-up performance.
●
●
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
Symbol
V
Symbol
ESD(HBM)
S
EMI
A supply overvoltage (applied to each power supply pin)
a current injection (applied to each input, output and configurable I/O pin) performed on
each sample.
Peak level
Parameter
Electrostatic discharge voltage
(human body model)
Ratings
V
SO20 package,
conforming to
SAE J 1752/3
DD
=5V, T
Conditions
(1)
Doc ID 12321 Rev 5
A
=+25°C,
T
A
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
= +25 °C
frequency band
Monitored
Conditions
8/4 MHz 16/8 MHz
Max vs. [f
TBD
TBD
TBD
TBD
Maximum value
ST72344xx ST72345xx
>2000
OSC
TBD
TBD
TBD
TBD
/f
CPU
(1)
]
dBµV
Unit
Unit
-
V