tza3013bu-n3 NXP Semiconductors, tza3013bu-n3 Datasheet - Page 14

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tza3013bu-n3

Manufacturer Part Number
tza3013bu-n3
Description
Sdh/sonet Stm16/oc48 Transimpedance Amplifier
Manufacturer
NXP Semiconductors
Datasheet
Philips Semiconductors
Physical characteristics of the bare die
2001 Feb 26
handbook, halfpage
Glass passivation
Bonding pad dimension
Metallization
Thickness
Size
Backing
Attach temperature
Attach time
SDH/SONET STM16/OC48
transimpedance amplifier
810
Fig.16 Bonding pad locations of the TZA3013AU.
m
PARAMETER
DREF
INQ
IN
1
2
3
15
4
x
1230 m
0
14
0.3 m PSG (PhosphoSilicate Glass) on top of 0.8 m silicon nitride
minimum dimension of exposed metallization is 90
except pads 2 and 3 which have exposed metallization of 80
(pad size = 90
2.8 m AlCu
380 m nominal
0.810
silicon; electrically connected to GND potential through substrate contacts
<440 C; recommended die attach is glue
<15 s
0
5
y
TZA3013AU
13
6
12
1.230 mm (0.996 mm
7
11
8
10
9
MGT101
90 m)
GNDD
TESTC
14
2
)
handbook, halfpage
810
Fig.17 Bonding pad locations of the TZA3013BU.
m
DREF
VALUE
INQ
IN
1
2
3
TZA3013A; TZA3013B
90 m (pad size = 100
15
4
x
1230 m
0
14
0
5
80 m
y
TZA3013BU
13
6
Product specification
12
7
11
8
10
9
MGT167
100 m)
GNDD
TESTC

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