DSP56800ERM FREESCALE [Freescale Semiconductor, Inc], DSP56800ERM Datasheet - Page 18

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DSP56800ERM

Manufacturer Part Number
DSP56800ERM
Description
16-bit Digital Signal Controllers
Manufacturer
FREESCALE [Freescale Semiconductor, Inc]
Datasheet
18
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Table 2-3 56F8013 Signal and Package Information for the 32-Pin LQFP (Continued)
(FAULT3)
(GPIOD2)
(GPIOD3)
(GPIOD0)
GPIOB5
Signal
Name
TCK
TMS
(T1)
TDI
Table 2-2
Pin No.
LQFP
14
31
30
4
Output
Output
Output
Output
Output
Output
Input/
Input/
Input/
Input/
Input/
Type
Input
Input
Input
State During
Input, pulled
Input, pulled
Input, pulled
Input, pulled
internally
internally
internally
internally
Reset
high
high
high
high
56F8013 Technical Data, Rev. 2
Port B GPIO — This GPIO pin can be individually programmed as
an input or output pin.
T1 — Timer, Channel 1
FAULT3 — This fault input pin is used for disabling selected PWM
outputs in cases where fault conditions originate off-chip.
After reset, the default state is GPIOB5. The peripheral functionality
is controlled via the SIM. See
Test Clock Input — This input pin provides a gated clock to
synchronize the test logic and shift serial data to the JTAG/EOnCE
port. The pin is connected internally to a pull-up resistor. A Schmitt
trigger input is used for noise immunity.
Port D GPIO — This GPIO pin can be individually programmed as
an input or output pin.
After reset, the default state is TCK.
Test Mode Select Input — This input pin is used to sequence the
JTAG TAP controller’s state machine. It is sampled on the rising
edge of TCK and has an on-chip pull-up resistor.
Port D GPIO — This GPIO pin can be individually programmed as
an input or output pin.
After reset, the default state is TMS.
Test Data Input — This input pin provides a serial input data stream
to the JTAG/EOnCE port. It is sampled on the rising edge of TCK
and has an on-chip pull-up resistor.
Port D GPIO — This GPIO pin can be individually programmed as
an input or output pin.
After reset, the default state is TDI.
Signal Description
Section
6.3.8.
Freescale Semiconductor
Preliminary

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