ATMEGA16A-MU Atmel, ATMEGA16A-MU Datasheet - Page 239
![MCU AVR 16K FLASH 16MHZ 44-QFN](/photos/12/13/121316/313-44-qfn_sml.jpg)
ATMEGA16A-MU
Manufacturer Part Number
ATMEGA16A-MU
Description
MCU AVR 16K FLASH 16MHZ 44-QFN
Manufacturer
Atmel
Series
AVR® ATmegar
Specifications of ATMEGA16A-MU
Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
16KB (8K x 16)
Program Memory Type
FLASH
Eeprom Size
512 x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
44-VQFN Exposed Pad
Processor Series
ATMEGA16x
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
2-Wire, SPI, USART
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWAVR, EWAVR-BL
Development Tools By Supplier
ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKIT
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 8 Channel
Package
44QFN EP
Device Core
AVR
Family Name
ATmega
Maximum Speed
16 MHz
Operating Supply Voltage
3.3|5 V
Controller Family/series
AVR MEGA
No. Of I/o's
32
Eeprom Memory Size
512Byte
Ram Memory Size
1KB
Cpu Speed
16MHz
Rohs Compliant
Yes
For Use With
ATSTK600 - DEV KIT FOR AVR/AVR32ATSTK500 - PROGRAMMER AVR STARTER KIT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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24.5.5
8154B–AVR–07/09
Scanning the Analog Comparator
Figure 24-7. Boundary-scan Cells for Oscillators and Clock Options
Table 24-4
XTAL1/XTAL2 connections as well as 32 kHz Timer Oscillator.
Table 24-4.
Notes:
The relevant Comparator signals regarding Boundary-scan are shown in
Boundary-scan cell from
described in
The Comparator need not be used for pure connectivity testing, since all analog inputs are
shared with a digital port pin as well.
Enable Signal
EXTCLKEN
OSCON
RCOSCEN
OSC32EN
TOSKON
1. Do not enable more than one clock source as main clock at a time.
2. Scanning an Oscillator output gives unpredictable results as there is a frequency drift between
3. The clock configuration is programmed by fuses. As a fuse is not changed run-time, the clock
Previous
From
Cell
the Internal Oscillator and the JTAG TCK clock. If possible, scanning an external clock is
preferred.
configuration is considered fixed for a given application. The user is advised to scan the same
clock option as to be used in the final system. The enable signals are supported in the scan
chain because the system logic can disable clock options in sleep modes, thereby disconnect-
ing the Oscillator pins from the scan path if not provided. The INTCAP Fuses are not
supported in the scan-chain, so the boundary scan chain can not make a XTAL Oscillator
requiring internal capacitors to run unless the fuse is correctly programmed.
ShiftDR
summaries the scan registers for the external clock pin XTAL1, Oscillators with
Table
0
1
ClockDR
Scan Signals for the Oscillators
Scanned Clock Line
EXTCLK (XTAL1)
OSCCK
RCCK
OSC32CK
TOSCK
24-5.
D
UpdateDR
Q
Next
Cell
To
Figure 24-9
D
G
Q
EXTEST
0
1
is attached to each of these signals. The signals are
XTAL1/TOSC1
ENABLE
Clock Option
External Clock
External Crystal
External Ceramic Resonator
External RC
Low Freq. External Crystal
32 kHz Timer Oscillator
(1)(2)(3)
Oscillator
XTAL2/TOSC2
OUTPUT
Previous
From
Cell
ShiftDR
0
1
ATmega16A
ClockDR
Scanned Clock Line
when not Used
Figure
D
FF1
Q
Next
Cell
To
0
0
1
0
0
24-8. The
239
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