ATMEGA644V-10AU Atmel, ATMEGA644V-10AU Datasheet - Page 262

• Manufacturer Part Number: ATMEGA644V-10AU
• Description: IC AVR MCU FLASH 64K 44TQFP
• Manufacturer: Atmel
• Series: AVR® ATmegar

Specifications of ATMEGA644V-10AU

• Core Processor: AVR
• Core Size: 8-Bit
• Speed: 10MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Number Of I /o: 32
• Program Memory Size: 64KB (32K x 16)
• Program Memory Type: FLASH
• Eeprom Size: 2K x 8
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 44-TQFP, 44-VQFP
• Processor Series: ATMEGA64x
• Core: AVR8
• Data Bus Width: 8 bit
• Data Ram Size: 4 KB
• Interface Type: 2-Wire/SPI/USART
• Maximum Clock Frequency: 10 MHz
• Number Of Programmable I/os: 32
• Number Of Timers: 3
• Operating Supply Voltage: 1.8 V to 5.5 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 8-ch x 10-bit
• Package: 44TQFP
• Device Core: AVR
• Family Name: ATmega
• Maximum Speed: 10 MHz
• For Use With: ATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK600-DIP40 - STK600 SOCKET/ADAPTER 40-PDIP770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAG770-1005 - ISP 4PORT FOR ATMEL AVR MCU JTAG770-1004 - ISP 4PORT FOR ATMEL AVR MCU SPIATAVRISP2 - PROGRAMMER AVR IN SYSTEM
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

23.4.4
23.4.5
23.5
23.5.1
262
Boundary-scan Chain
ATmega644
AVR_RESET; 0xC
BYPASS; 0xF
Scanning the Digital Port Pins
• Update-DR: Data from the Boundary-scan chain is applied to the output latches. However, the
The AVR specific public JTAG instruction for forcing the AVR device into the Reset mode or
releasing the JTAG reset source. The TAP controller is not reset by this instruction. The one bit
Reset Register is selected as Data Register. Note that the reset will be active as long as there is
a logic “one” in the Reset Chain. The output from this chain is not latched.
The active states are:
• Shift-DR: The Reset Register is shifted by the TCK input.
Mandatory JTAG instruction selecting the Bypass Register for Data Register.
The active states are:
• Capture-DR: Loads a logic “0” into the Bypass Register.
• Shift-DR: The Bypass Register cell between TDI and TDO is shifted.
The Boundary-scan chain has the capability of driving and observing the logic levels on the digi-
tal I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
off-chip connection.
Figure 23-3
disabled during Boundary-scan when the JTAG IC contains EXTEST or SAMPLE_PRELOAD.
The cell consists of a bi-directional pin cell that combines the three signals Output Control -
OCxn, Output Data - ODxn, and Input Data - IDxn, into only a two-stage Shift Register. The port
and pin indexes are not used in the following description
The Boundary-scan logic is not included in the figures in the datasheet.
simple digital port pin as described in the section
details from
When no alternate port function is present, the Input Data - ID - corresponds to the PINxn Regis-
ter value (but ID has no synchronizer), Output Data corresponds to the PORT Register, Output
Control corresponds to the Data Direction - DD Register, and the Pull-up Enable - PUExn - cor-
responds to logic expression PUD · DDxn · PORTxn.
Digital alternate port functions are connected outside the dotted box in
scan chain read the actual pin value. For analog function, there is a direct connection from the
external pin to the analog circuit. There is no scan chain on the interface between the digital and
the analog circuitry, but some digital control signal to analog circuitry are turned off to avoid driv-
ing contention on the pads.
When JTAG IR contains EXTEST or SAMPLE_PRELOAD the clock is not sent out on the port
pins even if the CKOUT fuse is programmed. Even though the clock is output when the JTAG IR
contains SAMPLE_PRELOAD, the clock is not sampled by the boundary scan.
output latches are not connected to the pins.
Figure 23-3
shows the Boundary-scan Cell for a bi-directional port pin. The pull-up function is
replaces the dashed box in
”I/O-Ports” on page
Figure
23-4.
Figure 23-4
65. The Boundary-scan
Figure 23-4
2593N–AVR–07/10
to make the
shows a