ATMEGA169L-8MI Atmel, ATMEGA169L-8MI Datasheet - Page 244

• Manufacturer Part Number: ATMEGA169L-8MI
• Description: IC MCU AVR 16K LV 8MHZ IND 64QFN
• Manufacturer: Atmel
• Series: AVR® ATmegar

Specifications of ATMEGA169L-8MI

• Core Processor: AVR
• Core Size: 8-Bit
• Speed: 8MHz
• Connectivity: SPI, UART/USART, USI
• Peripherals: Brown-out Detect/Reset, LCD, POR, PWM, WDT
• Number Of I /o: 53
• Program Memory Size: 16KB (8K x 16)
• Program Memory Type: FLASH
• Eeprom Size: 512 x 8
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-MLF®, 64-QFN
• For Use With: ATAVRISP2 - PROGRAMMER AVR IN SYSTEMATAVRBFLY - KIT EVALUATION AVR BUTTERFLYATSTK502 - MOD EXPANSION AVR STARTER 500
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: ATMEGA169L-4MI; ATMEGA169L-4MI

244
ATmega169V/L
Table 105. Boundary-scan Signals for the ADC
Note:
If the ADC is not to be used during scan, the recommended input values from Table 105
should be used. The user is recommended not to use the Differential Gain stages dur-
ing scan. Switch-Cap based gain stages require fast operation and accurate timing
which is difficult to obtain when used in a scan chain. Details concerning operations of
the differential gain stage is therefore not provided.
The AVR ADC is based on the analog circuitry shown in Figure 114 with a successive
approximation algorithm implemented in the digital logic. When used in Boundary-scan,
the problem is usually to ensure that an applied analog voltage is measured within some
limits. This can easily be done without running a successive approximation algorithm:
apply the lower limit on the digital DAC[9:0] lines, make sure the output from the com-
parator is low, then apply the upper limit on the digital DAC[9:0] lines, and verify the
output from the comparator to be high.
The ADC need not be used for pure connectivity testing, since all analog inputs are
shared with a digital port pin as well.
When using the ADC, remember the following
•
•
•
As an example, consider the task of verifying a 1.5V ± 5% input signal at ADC channel 3
when the power supply is 5.0V and AREF is externally connected to V
Signal
Name
SCTEST
ST
VCCREN
The port pin for the ADC channel in use must be configured to be an input with pull-
up disabled to avoid signal contention.
In Normal mode, a dummy conversion (consisting of 10 comparisons) is performed
when enabling the ADC. The user is advised to wait at least 200ns after enabling the
ADC before controlling/observing any ADC signal, or perform a dummy conversion
before using the first result.
The DAC values must be stable at the midpoint value 0x200 when having the HOLD
signal low (Sample mode).
1. Incorrect setting of the switches in Figure 114 will make signal contention and may
damage the part. There are several input choices to the S&H circuitry on the negative
input of the output comparator in Figure 114. Make sure only one path is selected
from either one ADC pin, Bandgap reference source, or Ground.
The lower limit is:
The upper limit is:
Direction
as Seen
from the
ADC
Input
Input
Input
Description
Switch-cap TEST
enable. Output from
x10 gain stage send
out to Port Pin having
ADC_4
Output of gain stages
will settle faster if this
signal is high first two
ACLK periods after
AMPEN goes high.
Selects Vcc as the
ACC reference
voltage.
1024 1,5V 0,95 5V
1024 1,5V 1,05 5V
(1)
Recommen-
ded Input
when not
in Use
(Continued)
=
=
0
0
0
291
323
=
=
0x123
0x143
Output Values when
Recommended Inputs
are Used, and CPU is
not Using the ADC
CC
.
2514H–AVR–05/03
0
0
0