MOCD208R2M Fairchild Semiconductor, MOCD208R2M Datasheet - Page 3

Transistor Output Optocouplers 8-Pin Optocoupler 2Ch Phototransistor

MOCD208R2M

Manufacturer Part Number
MOCD208R2M
Description
Transistor Output Optocouplers 8-Pin Optocoupler 2Ch Phototransistor
Manufacturer
Fairchild Semiconductor
Datasheet

Specifications of MOCD208R2M

Maximum Input Diode Current
60 mA
Maximum Reverse Diode Voltage
6 V
Output Device
Phototransistor
Output Type
DC
Configuration
2 Channel
Input Type
DC
Maximum Collector Emitter Voltage
70 V
Maximum Collector Emitter Saturation Voltage
0.4 V
Isolation Voltage
2500 Vrms
Current Transfer Ratio
125 %
Maximum Forward Diode Voltage
1.55 V
Maximum Collector Current
150 mA
Maximum Power Dissipation
250 mW
Maximum Operating Temperature
+ 100 C
Minimum Operating Temperature
- 40 C
Package / Case
SOIC-8 Narrow
Number Of Elements
2
Reverse Breakdown Voltage
6V
Forward Voltage
1.55V
Forward Current
60mA
Collector-emitter Voltage
70V
Package Type
SOIC W
Collector Current (dc) (max)
150mA
Power Dissipation
250mW
Collector-emitter Saturation Voltage
0.4V
Pin Count
8
Mounting
Surface Mount
Operating Temp Range
-40C to 100C
Operating Temperature Classification
Industrial
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
MOCD208R2M_NL

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©2003 Fairchild Semiconductor Corporation
MOCD207M, MOCD208M Rev. 1.0.6
Electrical Characteristics
*Typical values at T
Note:
1. Input-Output Isolation Voltage, V
2. For this test, Pins 1, 2, 3 and 4 are common and Pins 5, 6, 7 and 8 are common.
3. Always design to the specified minimum/maximum electrical limits (where applicable).
4. Current Transfer Ratio (CTR) = I
Symbol
EMITTER
DETECTOR
COUPLED
V
V
V
(BR)CEO
(BR)CEO
CE (sat)
R
C
I
I
CTR
V
C
CEO
CEO
V
t
t
I
C
ISO
ISO
ISO
on
off
t
t
CE
R
r
f
F
Input Forward Voltage
Reverse Leakage Current
Capacitance
Collector-Emitter Dark Current
Collector-Emitter Breakdown
Voltage
Emitter-Collector Breakdown
Voltage
Collector-Emitter Capacitance
Current Transfer Ratio,
Collector to Emitter
Collector-Emitter Saturation
Voltage
Turn-On Time
Turn-Off Time
Rise Time
Fall Time
Isolation Surge Voltage
Isolation Resistance
Isolation Capacitance
A
= 25°C
Parameter
(4)
(2)
(2)
(1)(2)
C
ISO
/I
(T
F
, is an internal device dielectric breakdown rating.
x 100%.
A
= 25°C unless otherwise specified)
I
V
V
V
I
I
f = 1.0 MHz, V
I
I
I
I
R
I
R
I
R
I
R
f = 60Hz, t = 1 min.,
I
V
V
F
C
E
F
F
C
C
C
C
C
I-O
R
CE
CE
L
L
L
L
I-O
I-O
= 30mA
= 10mA, V
= 1mA, V
= 100µA
= 100µA
= 2.0mA, I
= 2.0mA, V
= 2.0mA, V
= 2.0mA, V
= 2.0mA, V
Test Conditions
= 100
= 100
= 100
= 100
= 6.0V
= 10V, T
= 10V, T
= 500V
= 0V, f = 1MHz
2µA
CE
A
A
3
CE
F
CC
CC
CC
CC
CE
= 25°C
= 100°C
= 5V
= 10mA
= 5V
= 10V,
= 10V,
= 10V,
= 10V,
= 0V
MOCD207M
MOCD208M
MOCD207M
MOCD208M
Device
(3)
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
Min. Typ.* Max.
2500
10
100
7.0
70
40
34
13
11
0.001
1.25
100
1.0
1.0
7.0
3.0
2.8
1.6
2.2
0.2
18
10
1.55
100
200
125
0.4
50
www.fairchildsemi.com
Vac(rms)
Unit
µA
pF
nA
µA
pF
pF
µs
µs
µs
µs
%
V
V
V
V

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