ADUC7061BCPZ32 Analog Devices Inc, ADUC7061BCPZ32 Datasheet - Page 14

• Manufacturer Part Number: ADUC7061BCPZ32
• Description: DUAL 24-BIT AFE AND ARM 7 I.C
• Manufacturer: Analog Devices Inc
• Series: MicroConverter® ADuC7xxxr

Specifications of ADUC7061BCPZ32

• Design Resources: USB Based Temperature Monitor Using ADuC7061 and an External RTD (CN0075) 4 mA-to-20 mA Loop-Powered Temperature Monitor Using ADuC7060/1 (CN0145)
• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 10MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: POR, PWM, Temp Sensor, WDT
• Number Of I /o: 8
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Ram Size: 4K x 8
• Voltage - Supply (vcc/vdd): 2.375 V ~ 2.625 V
• Data Converters: A/D 5x24b, 8x24b, D/A 1x14b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 32-LFCSP
• Package: 32LFCSP EP
• Device Core: ARM7TDMI
• Family Name: ADuC7xxx
• Maximum Speed: 10.24 MHz
• Operating Supply Voltage: 2.5 V
• Data Bus Width: 16|32 Bit
• Number Of Programmable I/os: 14
• Interface Type: I2C/SPI/UART
• On-chip Adc: 2(4-chx24-bit)
• Number Of Timers: 4
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADuC7060/ADuC7061
ABSOLUTE MAXIMUM RATINGS
T
Table 7.
Parameter
AGND to DGND to AVDD to DVDD
Digital I/O Voltage to DGND
VREF± to AGND
ADC Inputs to AGND
ESD (Human Body Model) Rating
Storage Temperature
Junction Temperature
Lead Temperature
A
All Pins
Transient
Continuous
Soldering Reflow (15 sec)
= −40°C to +125°C, unless otherwise noted.
Rating
−0.3 V to +0.3 V
−0.3 V to +3.3 V
−0.3 V to AVDD + 0.3 V
−0.3 V to AVDD + 0.3 V
±2 kV
125°C
150°C
130°C
260°C
Rev. B | Page 14 of 108
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION