FDS4935BZ Fairchild Semiconductor, FDS4935BZ Datasheet

IC MOSFET P-CH DUAL 30V 8-SOIC

FDS4935BZ

Manufacturer Part Number
FDS4935BZ
Description
IC MOSFET P-CH DUAL 30V 8-SOIC
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Type
Power MOSFETr
Datasheet

Specifications of FDS4935BZ

Fet Type
2 P-Channel (Dual)
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
22 mOhm @ 6.9A, 10V
Drain To Source Voltage (vdss)
30V
Current - Continuous Drain (id) @ 25° C
6.9A
Vgs(th) (max) @ Id
3V @ 250µA
Gate Charge (qg) @ Vgs
40nC @ 10V
Input Capacitance (ciss) @ Vds
1360pF @ 15V
Power - Max
900mW
Mounting Type
Surface Mount
Package / Case
8-SOIC (3.9mm Width)
Number Of Elements
2
Polarity
P
Channel Mode
Enhancement
Drain-source On-res
0.022Ohm
Drain-source On-volt
30V
Gate-source Voltage (max)
±25V
Drain Current (max)
6.9A
Power Dissipation
1.6W
Output Power (max)
Not RequiredW
Frequency (max)
Not RequiredMHz
Noise Figure
Not RequireddB
Power Gain
Not RequireddB
Drain Efficiency
Not Required%
Operating Temp Range
-55C to 150C
Operating Temperature Classification
Military
Mounting
Surface Mount
Pin Count
8
Package Type
SOIC N
Configuration
Dual Dual Drain
Transistor Polarity
P-Channel
Resistance Drain-source Rds (on)
0.022 Ohm @ 10 V
Forward Transconductance Gfs (max / Min)
22 S
Drain-source Breakdown Voltage
30 V
Gate-source Breakdown Voltage
+/- 25 V
Continuous Drain Current
6.9 A
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Module Configuration
Dual
Continuous Drain Current Id
-6.9A
Drain Source Voltage Vds
-30V
On Resistance Rds(on)
22mohm
Rds(on) Test Voltage Vgs
-10V
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDS4935BZTR

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FDS4935BZ
Manufacturer:
Fairchild Semiconductor
Quantity:
27 910
Part Number:
FDS4935BZ
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
FDS4935BZ
0
Part Number:
FDS4935BZ-NL
Manufacturer:
ON/安森美
Quantity:
20 000
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Kalabkova, Ivana
E-mail: Ivana.Kalabkova@notes.fairchildsemi.com
Phone: 408-822-2187
Implementation of change:
Expected 1st Device Shipment Date: 2008/03/02
Earliest Year/Work Week of Changed Product: 0810
Change Type Description: Die Revision
Description of Change (From): Current die size: 76x38
Description of Change (To): New die size: 83x40
Reason for Change : The mask set for this device was modified to improve the Rg performance
of the part from a typical of 9 Ohms to 4.5 Ohms.
Qual/REL Plan Numbers : Q20050144
Qualification :
All qualification tests passed the defined qualification plan requirement.
Results/Discussion
Test: (High Temperature Reverse Bias)
Lot
Q20050144AAHTRB
Q20050144ABHTRB
Test: 130C (Highly Accelerated Stress Test)
Lot
Q20050144AAHAST1
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Device
FDS6681Z
Technical Contact:
Name: Rivero, Douglas
E-mail: Doug.Rivero@fairchildsemi.com
Phone: 1-408-822-2143
Device
FDS6681Z
168-HOURS
0/79
0/79
500-HOURS
0/79
0/79
96-HOURS
0/79
1000-HOURS
0/79
0/79
Date Issued On : 2007/12/05
Date Created : 2007/11/28
Failure Code
Failure Code
PCN# : Q4074807
Pg. 1

Related parts for FDS4935BZ

FDS4935BZ Summary of contents

Page 1

... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...

Page 2

... Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition) Lot Device Q20050144AAPCNL1A FDS6681Z Q20050144ABPCNL1A FDS6681Z Product Id Description : Fairchild Semiconductor's selected products in the NMSON package. Products affected by this change are listed below in the "Affected FSIDs" section. Affected FSIDs : FDS4935BZ 0/79 Results 0/79 0/79 FDS4935BZ_SBME002 Failure Code Pg. 2 ...

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