FDS3912 Fairchild Semiconductor, FDS3912 Datasheet
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FDS3912
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FDS3912 Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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Lot Device Q20070231AAACLV FDS6912A Q20070231BAACLV FDS3570 Q20070231CAACLV FDS3672 Q20070231DAACLV FDS8870 Test: (High Temperature Gate Bias) Lot Device Q20070231AAHTGB FDS6912A Q20070231BAHTGB FDS3570 Q20070231CAHTGB FDS3672 Q20070231DAHTGB FDS8870 Test: (High Temperature Reverse Bias) Lot Device Q20070231AAHTRB FDS6912A Q20070231BAHTRB FDS3570 Q20070231CAHTRB FDS3672 Q20070231DAHTRB FDS8870 ...
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... Product Id Description : This change affects certain SO-8 products currently assembled in our Pg. 2 subcontractor site, GEM Electronics Ltd. The products affected by this change are listed below in the "Affected FSIDs" section. Affected FSIDs : FDS2572 FDS2582_NL FDS3590_F095 FDS3672 FDS3692 FDS3912_NL FDS4410_NL FDS4465_F095 FDS4480_NF40 FDS4501H_NL FDS4935A_NF40 FDS5670_NF40 FDS5680_NF40 FDS5690_F095 ...