FDMC8878 Fairchild Semiconductor, FDMC8878 Datasheet
FDMC8878
Specifications of FDMC8878
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FDMC8878 Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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Change To Qualification Stress Test and Sample Size Detail Device #1 FDM6296 Package: #Leads: Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard HAST2 X JESD22-A110 85%RH, 110C, PRCL MIL- STD-750-1036 TMCL1 X JESD22-A104 -65C, 150C ...
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... Readpoints Conditions TP1 TP2 264 24V 168 500 168 500 Delta 100CC, 2 5000 10000 Min cycle 100 500 FDM3300NZ_NL FDM6296 FDMC2610 FDMC5614P FDMC8878 A 0 Samples TP3 1000 77 1000 Read- Sample points A 0 Samples TP3 1000 77 1000 FDM3622 FDM6296_NL FDMC2674 FDMC8554 FDMC8878_NBSE003 Pg. 3 ...