FDM6296 Fairchild Semiconductor, FDM6296 Datasheet
FDM6296
Specifications of FDM6296
FDM6296TR
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FDM6296 Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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... Test: (High Temperature Reverse Bias) Lot Device Q20070296BAHTRB FDMC2674 Q20070296BAHTRB FDMC2674 Q20070296CAHTRB FDMC8854 Q20070296CAHTRB FDMC8854 Test: (Power Cycle) Lot Device Q20070296AAPRCL FDM6296 Q20070296AAPRCL FDM6296 Q20070296BAPRCL FDMC2674 Q20070296BAPRCL FDMC2674 Q20070296CAPRCL FDMC8854 Q20070296CAPRCL FDMC8854 Test: -65C, 150C (Temperature Cycle) Lot Device 96-HOURS Failure Code 0/77 0/77 500-HOURS ...
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... For a complete listing of products covered in this PCN release, please refer to the affected FSID listing. Affected FSIDs : FDM3300NZ FDM3622_NL FDMC2523P FDMC3300NZA FDMC8854 0/77 0/77 0/77 0/77 0/77 0/77 264-HOURS 0/77 0/77 0/77 Results 0/154 0/231 0/231 FDM3300NZ_NL FDM6296 FDMC2610 FDMC5614P FDMC8878 Failure Code Failure Code FDM3622 FDM6296_NL FDMC2674 FDMC8554 FDMC8878_NBSE003 Pg. 3 ...