FDMC2610 Fairchild Semiconductor, FDMC2610 Datasheet

MOSFET N-CH 200V 2.2A POWER33-8

FDMC2610

Manufacturer Part Number
FDMC2610
Description
MOSFET N-CH 200V 2.2A POWER33-8
Manufacturer
Fairchild Semiconductor
Series
UniFET™r
Datasheet

Specifications of FDMC2610

Fet Type
MOSFET N-Channel, Metal Oxide
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
200 mOhm @ 2.2A, 10V
Drain To Source Voltage (vdss)
200V
Current - Continuous Drain (id) @ 25° C
2.2A
Vgs(th) (max) @ Id
4V @ 250µA
Gate Charge (qg) @ Vgs
18nC @ 10V
Input Capacitance (ciss) @ Vds
960pF @ 100V
Power - Max
2.1W
Mounting Type
Surface Mount
Package / Case
8-MLP, Power33
Configuration
Single Quad Drain Triple Source
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.2 Ohms
Forward Transconductance Gfs (max / Min)
7 S
Drain-source Breakdown Voltage
200 V
Gate-source Breakdown Voltage
+/- 20 V
Continuous Drain Current
9.5 A
Power Dissipation
42 W
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDMC2610TR

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FDMC2610
Manufacturer:
FAIRCHILD/ON
Quantity:
20 000
Company:
Part Number:
FDMC2610
Quantity:
3 000
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Lam, HH
E-mail: HH.Lam@fairchildsemi.com
Phone: 604 850 2392
Implementation of change:
Expected 1st Device Shipment Date: 2008/03/20
Earliest Year/Work Week of Changed Product: 0813
Change Type Description: Mold Compound
Description of Change (From): 8L MLP3x3 package assembly at all FSC approved
manufacturing location(s) (Carsem) using non Green mold compound as shown in table 1.
Description of Change (To): 8L MLP 3x3 package assembly at all FSC approved manufacturing
location(s) (Carsem) using Green mold compound as shown in table 2.
Reason for Change : Green initiative by Fairchild Semiconductor. Fairchild Semiconductor is
dedicated to being a good corporate citizen. All Fairchild Semiconductor products are 2nd level
interconnect lead-free and RoHS compliance. The referenced material changes have been made
to provide a 'Full Green' (Halogen Free Flame Retardant) package. For additional details on the
corporate wide green initiative please visit our Web site at:
http://www.fairchildsemi.com/company/green/index.html Manufacturing will occur at the same
assembly facilities producing the current non-green products. Package outline drawings of the
affected products remain un-changed. Green products will be fully compliant to all published
data sheet specifications and will be interchangeable with current non-green product. Quality
and reliability will remain at the highest standards already demonstrated with Fairchild's
existing products.
Qual/REL Plan Numbers : Q20070296
Qualification :
All the reliability tests defined in this qual plan completed with no failures. Therefore
Carsem is qualified to assemble MLP 3x3 8L package.
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: Po, Peter
E-mail: peter.po@fairchildsemi.com
Phone: 604 850 2744
Date Issued On : 2008/03/17
Date Created : 2008/01/25
PCN# : Q4074601-A
Pg. 1

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FDMC2610 Summary of contents

Page 1

... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...

Page 2

Change From Change To Results/Discussion Test: (Autoclave) Lot Device Q20070296BAACLV FDMC2674 Q20070296CAACLV FDMC8854 Test: (High Temperature Gate Bias) Lot Device Q20070296BAHTGB FDMC2674 Q20070296BAHTGB FDMC2674 Q20070296CAHTGB FDMC8854 Q20070296CAHTGB FDMC8854 Test: (High Temperature Reverse Bias) Lot Device Q20070296BAHTRB FDMC2674 Q20070296BAHTRB FDMC2674 Q20070296CAHTRB ...

Page 3

... For a complete listing of products covered in this PCN release, please refer to the affected FSID listing. Affected FSIDs : FDM3300NZ FDM3622_NL FDMC2523P FDMC3300NZA FDMC8854 0/77 0/77 0/77 0/77 0/77 0/77 264-HOURS 0/77 0/77 0/77 Results 0/154 0/231 0/231 FDM3300NZ_NL FDM6296 FDMC2610 FDMC5614P FDMC8878 Failure Code Failure Code FDM3622 FDM6296_NL FDMC2674 FDMC8554 FDMC8878_NBSE003 Pg. 3 ...

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