BFP 520 H6327 Infineon Technologies, BFP 520 H6327 Datasheet
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BFP 520 H6327
Specifications of BFP 520 H6327
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BFP 520 H6327 Summary of contents
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NPN Silicon RF Transistor Low noise amplifier designed for low voltage applications, ideal for 1 1.8 V supply voltage. Supports 2 collector resistance. High gain and low noise at high frequencies due to high transit frequency ...
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Thermal Resistance Parameter 1) Junction - soldering point Electrical Characteristics at T Parameter DC Characteristics Collector-emitter breakdown voltage mA Collector-emitter cutoff current ...
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Electrical Characteristics at T Parameter AC Characteristics (verified by random sampling) Transition frequency mA GHz C CE Collector-base capacitance MHz ...
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Total power dissipation P 120 mW 100 Third order Intercept Point IP (Output parameter, f ...
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Power gain |S21|² Power ...
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Noise figure 1.8 GHz 1 50Ohm Zs = Zsopt 0 Source impedance for min. noise figure ...
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SPICE GP Model For the SPICE Gummel Poon (GP) model as well as for the S-parameters (including noise parameters) please refer to our internet website www.infineon.com/rf.models. Please consult our website and download the latest versions before actually starting your design. ...
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Package Outline +0.1 0.3 -0.05 4x 0.1 Foot Print Marking Layout (Example) Standard Packing Reel ø180 mm = 3.000 Pieces/Reel Reel ø330 mm = 10.000 Pieces/Reel Pin 1 Package SOT343 2 ±0.2 0.1 MAX. 1.3 0 0.15 1 ...
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Datasheet Revision History: 16 August 2010 This datasheet replaces the revision from 30 March 2007 and 28 June 2010. The product itself has not been changed and the device characteristics remain unchanged. Only the product description and information available in ...
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... For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. ...