ML610Q408-NNNTBZ03A7 Rohm Semiconductor, ML610Q408-NNNTBZ03A7 Datasheet - Page 339

• Manufacturer Part Number: ML610Q408-NNNTBZ03A7
• Description: MCU 8BIT 16K FLASH 8CH 100-TQFP
• Manufacturer: Rohm Semiconductor
• Series: -r

Specifications of ML610Q408-NNNTBZ03A7

• Core Processor: nX-U8/100
• Core Size: 8-Bit
• Speed: 2MHz
• Connectivity: SSP, UART/USART
• Peripherals: LCD, Melody Driver, POR, PWM, WDT
• Number Of I /o: 22
• Program Memory Size: 16KB (8K x 16)
• Program Memory Type: FLASH
• Eeprom Size: -
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 1.25 V ~ 3.6 V
• Data Converters: A/D 2x16b
• Oscillator Type: Internal
• Operating Temperature: -20°C ~ 70°C
• Package / Case: 100-TFQFP
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

24. On-Chip Debug Function
24.1 Overview
24.2 Method of Connecting to On-Chip Debug Emulator
This LSI has an on-chip debug function allowing Flash memory rewriting.
The on-chip debug emulator (uEASE) is connected to this LSI to perform the on-chip debug function.
This function is included only in the ML610Q407 to 409 and not in the ML610407 to 409.
Figure 24-1 shows connection to the on-chip debug emulator (uEASE).
For on-chip debug emulator, see “uEASE User’s Manual”.
Note:
•When using the on-chip debug function or the flash rewrite function after mounting of the board, design the board
so that the 6 pins (V
emulator can be connected.
•“3.0V to 3.6V” has to be supplied to V
For details, see “uEASE User’s Manual” and “uEASE Target Connection Manual”.
•Please do not apply LSIs being used for debugging to mass production.
uEASE
Figure 24-1 Connection to On-chip Debug Emulator (uEASE)
PP
, V
DDL
V
V
V
V
TEST
RESET_N
, V
PP
DDL
DD
SS
DD
, V
SS
, TEST0, and TEST1_N) required for connection to the on-chip debug
DD
while debugging and writing flash.
Interface connector
24-1
User application circuit
V
V
V
V
TEST0
TEST1_N
ML610Q407/8/9
PP
DDL
DD
SS
Chapter 24 On-chip Debug