FIN3386MTD Fairchild Semiconductor, FIN3386MTD Datasheet - Page 18

• Manufacturer Part Number: FIN3386MTD
• Manufacturer: Fairchild Semiconductor

Specifications of FIN3386MTD

• Number Of Elements: 4
• Number Of Receivers: 4
• Number Of Drivers: 28
• Input Type: CMOS/TTL
• Operating Supply Voltage (typ): 3.3V
• Differential Input High Threshold Voltage: 100mV
• Diff. Input Low Threshold Volt: -100mV
• Output Type: Deserializer
• Operating Supply Voltage (min): 3V
• Operating Supply Voltage (max): 3.6V
• Operating Temp Range: -10C to 70C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 56
• Package Type: TSSOP
• Lead Free Status / Rohs Status: Compliant

© 2003 Fairchild Semiconductor Corporation
FIN3383/3384/3385/3386 • Rev. 1.0.4
AC Loadings and Waveforms
Note:
Note:
26. Test setup used considers no requirement for separation of RMS and deterministic jitter. Other hardware
27. This jitter pattern is used to test the jitter response (clock out) of the device over the power supply range with
28. Switching input data TxIn0 to TxIn20 at 0.5MHz and the input clock is shifted to left -3ns and to
29. The ±3ns cycle-to-cycle input jitter is the static phase error between the two clock sources. Jumping between
setup, such as Wavecrest boxes, can be used if no M1 software is available, but the test methodology in
Figure 24 should be followed.
worst jitter ±3ns (cycle-to-cycle) clock input. The specific test methodology is as follows:
the right +3ns when data is HIGH.
two clock sources to simulate the worst-case of clock-edge jump (3ns) from graphical controllers. Cycle-to-
cycle jitter at TxCLKOut pin should be measured cross V
<2MHz).
Figure 24. Timing Diagram of Transmitter Clock Input with Jitter
Figure 23. Transmitter Clock Out Jitter Measurement Setup
(Continued)
18
CC
range with 100mV noise (V
CC
noise frequency
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