FIN224ACGFX Fairchild Semiconductor, FIN224ACGFX Datasheet
FIN224ACGFX
Specifications of FIN224ACGFX
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FIN224ACGFX Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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... FIN224ACGFX Q20060387ACTMCL1D FIN224ACGFX Q20060387ACTMCL1D FIN224ACGFX Test: 110C (Highly Accelerated Stress Test) Lot Device Q20060387AAHAST2D FIN224ACGFX Q20060387AAHAST2D FIN224ACGFX Q20060387ABHAST2D FIN224ACGFX Q20060387ABHAST2D FIN224ACGFX Q20060387ACHAST2D FIN224ACGFX Q20060387ACHAST2D FIN224ACGFX Test: MSL(2), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition) Lot Device Q20060387AAPCNL2AD FIN224ACGFX Q20060387ABPCNL2AD FIN224ACGFX Q20060387ACPCNL2AD FIN224ACGFX 168-HOURS 1000-HOURS ...
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... Product Id Description : Affected FSIDs : FIN12ACGFX FIN24ACGFX FIN668CGFX FIN212ACGFX FIN24CGFX FIN670CGFX FIN224ACGFX FIN324CGFX Pg. 3 ...