FFPF60SA60DS Fairchild Semiconductor, FFPF60SA60DS Datasheet - Page 3

• Manufacturer Part Number: FFPF60SA60DS
• Manufacturer: Fairchild Semiconductor

©2004 Fairchild Semiconductor Corporation
Typical Characteristics
Test Circuits and Waveforms
V
I = 1A
L = 40mH
R < 0.1
V
E
Q
V
R
t
GE
1
GE
DD
AVL
G
1
AND t
= IGBT (BV
CONTROL dI
AMPLITUDE AND
= 50V
= 1/2LI
Figure 5. Typical Reverse Recovery Current
6
5
4
3
2
1
0
100
2
Figure 9. Avalanche Energy Test Circuit
CONTROL I
t
1
2
[V
CES
t
R(AVL)
F
2
/dt
Figure 7. t
> DUT V
F
/(V
R(AVL)
Q1
R(AVL)
200
vs. di/dt
R
G
di/dt [A/ s]
- V
rr
)
DD
Test Circuit
)]
DUT
CURRENT
L
SENSE
MOSFET
300
DUT
I
T
F
C
= 8A
= 25
CURRENT
400
(Continued)
SENSE
L
o
C
500
R
600
-
+
V
-
+
V
DD
DD
Figure 10. Avalanche Current and Voltage Waveforms
0
I V
t
0
I
10
F
5
0
Figure 6. Forward Curent Derating Curve
60
Figure 8. t
dI
dt
F
I
L
80
Case Temperature , T
rr
Waveforms and Definitions
t
1
100
V
I
t
AVL
L
a
120
t
t
2
rr
C
[
o
t
C]
b
140
0.25 I
I
RM
Rev. A, October 2004
t
160
RM