MT58L64V36P Micron Semiconductor, MT58L64V36P Datasheet - Page 12
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MT58L64V36P
Manufacturer Part Number
MT58L64V36P
Description
(MT58LxxxxP) 2Mb SRAM
Manufacturer
Micron Semiconductor
Datasheet
1.MT58L64V36P.pdf
(20 pages)
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NOT RECOMENDED FOR NEW DESIGNS
TQFP THERMAL RESISTANCE
NOTE: 1. Typical values are measured at 3.3V, 25°C and 10ns cycle time.
2Mb: 128K x 18, 64K x 32/36 Pipelined, SCD SyncBurst SRAM
MT58L128L18P_C.p65 – Rev. C, Pub. 11/02
DESCRIPTION
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Top of Case)
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA/JESD51.
CONDITIONS
12
PIPELINED, SCD SYNCBURST SRAM
2Mb: 128K x 18, 64K x 32/36
Micron Technology, Inc., reserves the right to change products or specifications without notice.
SYMBOL
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TYP
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UNITS NOTES
©2002, Micron Technology, Inc.
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