a1240a-pg132b Actel Corporation, a1240a-pg132b Datasheet - Page 9

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a1240a-pg132b

Manufacturer Part Number
a1240a-pg132b
Description
Hirel Fpgas
Manufacturer
Actel Corporation
Datasheet

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A ct e l E xt e n de d F l o w
Notes:
1.
2.
3.
Step
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
13.
14.
15.
16.
17.
Actel offers the extended flow for customers who require additional screening beyond the requirements of the MIL-STD-833, Class B. Actel is
compliant to the requirements of MIL-STD-883, Paragraph 1.2.1, and MIL-I-38535, Appendix A. Actel is offering this extended flow
incorporating the majority of the screening procedures as outlined in Method 5004 of MIL-STD-883, Class S. The exceptions to Method 5004
are shown in notes 2 and 3 below.
Wafer lot acceptance is performed to Method 5007; however, the step coverage requirement as specified in Method 2018 must be waived.
MIL-STD-883, Method 5004 requires 100 percent Radiation latch-up testing (Method 1020). Actel will not be performing any radiation testing,
and this requirement must be waived in its entirety.
Screen
Wafer Lot Acceptance
Destructive In-Line Bond Pull
Internal Visual
Serialization
Temperature Cycling
Constant Acceleration
Particle Impact Noise Detection
Radiographic
Pre-Burn-In Test
Burn-in Test
Interim (Post-Burn-In) Electrical Parameters In accordance with applicable Actel device specification
Reverse Bias Burn-In
Interim (Post-Burn-In) Electrical Parameters In accordance with applicable Actel device specification
Percent Defective Allowable (PDA)
Calculation
Final Electrical Test
a. Static Tests
b. Functional Tests
c. Switching Tests at 25°C
Seal
a. Fine
b. Gross
External Visual
(1) 25°C
(2) –55°C and +125°C
(1) 25°C
(2) –55°C and +125°C
(Subgroup 9, Table 1)
(Subgroup 1, Table1)
(Subgroups 2, 3, Table 1)
(Subgroup 7, Table 15)
(Subgroups 8A and B, Table 1)
2
1
3
Method
5007 with Step Coverage Waiver
2011, Condition D
2010, Condition A
1010, Condition C
2001, Condition D or E, Y
2020, Condition A
2012 (one view only)
In accordance with applicable Actel device specification
1015, Condition D, 240 hours @ 125°C minimum
1015, Condition C, 72 hours @ 150°C minimum
5%, 3% Functional Parameters @ 25°C
In accordance with Actel applicable device specification
which includes a, b, and c:
5005
5005
5005
5005
5005
1014
2009
1
Orientation Only
H iR e l F PG A s
Require-
Sample
All Lots
All Lots
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
ment
9

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