s29ns01gs Meet Spansion Inc., s29ns01gs Datasheet - Page 56

• Manufacturer Part Number: s29ns01gs
• Description: S29ns01gs 1024 Megabit 128 Megabyte 16-bit Data Width, Burst Access, Simultaneous Read/write, 1.8 Volt-only Flash Memory In 65 Nm Mirrorbit Technology
• Manufacturer: Meet Spansion Inc.

10.5
56
AC Test Conditions
Input level range
Input or CLK Rise Measurement
Input or CLK Fall Measurement
Input comparison level
Output data comparison level
Load capacitance (CL)
Input Transition time (t
CLK Transition time (t
CLK High/Low time (t
CLK
CL
CLKRF
T
) (input rise and fall times = 20% of t
/t
CH
) (CLK input rise and fall times = 20% of t
) ((t
CLK
S29NS-S MirrorBit
Parameter
/2 - t
V
0V
CLKRF
IO
D a t a
Figure 10.3 Input Pulse and Test Point
) * 0.9)
V
Device
Und er
Test
IO
/2
Figure 10.4 CLK Parameters
Figure 10.5 Output Load
S h e e t
t
®
CH
Eclipse
CLK
Outp ut Load
)
I nput and Output
™
* C
Test Point
Flash Family
L
( P r e l i m i n a r y )
CLK
= 30 pF including scope
and Jig capacitance
)
t
CLK
Limit
Max
Max
Max
Max
Max
Max
Max
Max
Max
Min
Min
Min
Min
104 MHz
108 MHz
104 MHz
108 MHz
104 MHz
108 MHz
66 MHz
83 MHz
66 MHz
83 MHz
66 MHz
83 MHz
V
f
CLK
IO
Condition
/2
t
CL
S29NS-S_00_02 April 20, 2009
11.9
9.26
11.9
9.26
11.9
9.26
t
9.6
9.6
9.6
CLK
15
15
15
0.0 to V
V
V
IL
IH
Value
V
V
3.00
2.50
1.85
1.50
3.00
2.50
1.85
1.50
3.20
4.1
2.6
2.0
IO
IO
30
to V
to V
/2
/2
CC
IH
IL
Units
pF
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
V
V
V
V