aduc7030 Analog Devices, Inc., aduc7030 Datasheet - Page 17

• Manufacturer Part Number: aduc7030
• Description: Integrated Precision Battery Sensor For Automotive
• Manufacturer: Analog Devices, Inc.

Preliminary Technical Data
TERMINOLOGY
Conversion Rate
The conversion rate specifies the rate at which an output result
is available from the ADC, once the ADC has settled.
The sigma-delta conversion techniques used on this part mean
that while the ADC front-end signal is over-sampled at a
relatively high sample rate, a subsequent digital filter is
employed to decimate the output to give a valid 16-Bit data
conversion result at output rates from 1Hz to 8 KHz.
It should also be noted that when software switches from one
input to another (on the same ADC), the digital filter must first
be cleared and then allowed to average a new result. Depending
on the configuration of the ADC and the type of filter this can
take multiple conversion cycles.
Integral Non Linearity (INL)
This is the maximum deviation of any code from a straight line
passing through the endpoints of the transfer function. The
endpoints of the transfer function are zero scale, a point 0.5
LSB below the first code transition and full scale, a point 0.5
LSB above the last code transition (111 . . . 110 to 111 . . . 111).
The error is expressed as a percentage of full scale.
No Missing Codes
This is a measure of the Differential Non-Linearity of the ADC.
The error is expressed in bits and specifies the number of codes
(ADC results) as 2^N Bits, where is N = No Missing Codes,
guaranteed to occur through the full ADC input range.
Offset Error
This is the deviation of the first code transition ADC input
voltage from the ideal first code transition.
Offset Error Drift
Offset Error Drift is the variation in absolute offset error with
respect to temperature. This error is expressed as LSBs per °C.
Gain Error
This is a measure of the span error of the ADC. It is a measure
of the difference between the measured and the ideal span
between any two points in the transfer function.
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Output Noise
The output noise is specified as the standard deviation (or 1 X
Sigma) of ADC output codes distribution collected when the
ADC input voltage is at a dc voltage. It is expressed as µ rms.
The output or RMS noise can be used to calculate the Effective
Resolution of the ADC as defined by the following equation
The peak-to-peak noise is defined as the deviation of codes that
fall within 6.6 Χ Sigma of the distribution of ADC output codes
collected when the ADC input voltage is at dc. The peak-to-
peak noise is therefore calculated as 6.6 times the rms noise.
The peak-to-peak noise can be used to calculate the ADC
(Noise Free, Code) Resolution for which there will be no code
flicker within a 6.6-Sigma limit as defined by the following
equation
Noise Free Code Resolution = Log
peak noise) Bits
Data Sheet Acronyms
ADC
ARM
JTAG
LIN
LSB
LVF
MCU
MMR
MSB
PID
POR
PSM
RMS
STI
Effective Resolution= Log
Least Significant Byte/Bit
Most Significant Byte/Bit
Root Mean Square
Analog to Digital Converter
Advanced RISC Machine
Joint Test Action Group
Local Interconnect Network
Low Voltage Flag
MicroController
Memory Mapped Register
Protected Identifier
Power On Reset
Power Supply Monitor
Serial Test Interface
2
ADuC7030/ADuC7033
(full-scale range/rms noise) Bits
2
(full-scale range/peak-to-