AM28F010-120EC AMD [Advanced Micro Devices], AM28F010-120EC Datasheet - Page 26

• Manufacturer Part Number: AM28F010-120EC
• Description: 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory
• Manufacturer: AMD [Advanced Micro Devices]

SWITCHING TEST WAVEFORMS
SWITCHING CHARACTERISTICS over operating range unless otherwise specified
AC Characteristics—Read Only Operation
Notes:
1. Guaranteed by design; not tested.
2. Not 100% tested.
26
AC Testing (all speed options except -70): Inputs are driven at
2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse rise
and fall times are 10 ns.
JEDEC
t
t
t
t
t
t
t
t
t
t
t
2.4 V
0.45 V
AVAV
ELQV
AVQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
AXQX
WHGL
VCS
Parameter
Symbols
Standard Parameter Description
t
t
t
t
t
t
t
t
t
RC
CE
ACC
OE
LZ
DF
OLZ
DF
OH
Input
Read Cycle Time (Note 2)
Chip Enable AccessTime
Address Access Time
Output Enable Access Time
Chip Enable to Output in Low Z (Note 2)
Chip Disable to Output in High Z (Note 1)
Output Enable to Output in Low Z (Note 2)
Output Disable to Output in High Z (Note 2)
Output Hold from first of Address, CE#, or
OE# Change (Note 2)
Write Recovery Time before Read
V
2.0 V
0.8 V
CC
Setup Time to Valid Read (Note 2)
Test Points
2.0 V
0.8 V
Output
Am28F010
AC Testing for -70 devices: Inputs are driven at 3.0 V for a
logic “1” and 0 V for a logic “0”. Input pulse rise and fall times
are 10 ns.
3 V
0 V
Max
Max
Max
Max
Max
Min
Min
Min
Min
Min
Min
1.5 V
-70
70
70
70
35
20
20
50
0
0
0
6
Input
Am28F010 Speed Options
-90
90
90
90
35
20
20
50
0
0
0
6
-120
120
120
120
Test Points
50
30
30
50
0
0
0
6
-150
150
150
150
55
35
35
50
0
0
0
6
Output
-200
200
200
200
55
35
35
50
0
0
0
6
11559H-15
1.5 V
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
µs