LFE3-150EA-7FN1156CTW Lattice, LFE3-150EA-7FN1156CTW Datasheet - Page 107

FPGA - Field Programmable Gate Array 149K LUTs 586 I/O 1.2V -7 Speed

LFE3-150EA-7FN1156CTW

Manufacturer Part Number
LFE3-150EA-7FN1156CTW
Description
FPGA - Field Programmable Gate Array 149K LUTs 586 I/O 1.2V -7 Speed
Manufacturer
Lattice
Datasheet

Specifications of LFE3-150EA-7FN1156CTW

Number Of Programmable I/os
133 to 586
Data Ram Size
6.85 Mbits
Delay Time
37 ns
Supply Voltage (max)
1.26 V
Supply Current
18 mA
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Supply Voltage (min)
1.14 V
Package / Case
FPBGA-1156
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
LFE3-150EA-7FN1156CTW
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
Lattice Semiconductor
Switching Test Conditions
Figure 3-26 shows the output test load that is used for AC testing. The speci• c values for resistance, capacitance,
voltage, and other test conditions are shown in Table 3-23.
Figure 3-26. Output Test Load, LVTTL and LVCMOS Standards
Table 3-23. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
*CL Includes Test Fixture and Probe Capacitance
DUT
V
R1
R2
T
1M
100
R
1
3-55
1M
100
R
CL*
2
Test Poi nt
0pF
0pF
0pF
0pF
0pF
C
DC and Switching Characteristics
L
LatticeECP3 Family Data Sheet
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.10
- 0.10
/2
/2
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
CCIO
CCIO
V
T

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