MT47H128M8HQ-187E:E Micron Technology Inc, MT47H128M8HQ-187E:E Datasheet - Page 30

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MT47H128M8HQ-187E:E

Manufacturer Part Number
MT47H128M8HQ-187E:E
Description
Manufacturer
Micron Technology Inc
Type
DDR2 SDRAMr
Datasheet

Specifications of MT47H128M8HQ-187E:E

Organization
128Mx8
Density
1Gb
Address Bus
17b
Access Time (max)
350ps
Maximum Clock Rate
1.066GHz
Operating Supply Voltage (typ)
1.8V
Package Type
FBGA
Operating Temp Range
0C to 85C
Operating Supply Voltage (max)
1.9V
Operating Supply Voltage (min)
1.7V
Supply Current
210mA
Pin Count
60
Mounting
Surface Mount
Operating Temperature Classification
Commercial
Lead Free Status / Rohs Status
Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MT47H128M8HQ-187E:E TR
Manufacturer:
Micron Technology Inc
Quantity:
10 000
Table 10: DDR2 Idd Specifications and Conditions (Die Revisions E and G) (Continued)
Notes: 1–7 apply to the entire table
PDF: 09005aef821ae8bf
Rev. O 9/08 EN
Parameter/Condition
Operating bank interleave read
current: All bank interleaving
reads, Iout = 0mA; BL = 4, CL = CL
(Idd), AL =
(Idd);
t
t
is HIGH between valid commands;
Address bus inputs are stable dur-
ing deselects; Data bus inputs are
switching; See Idd7 Conditions
(page 27) for details
RC =
RCD =
t
t
RC (Idd),
CK =
t
RCD (Idd); CKE is HIGH, CS#
t
RCD (Idd) - 1 ×
t
CK (Idd),
t
RRD =
Notes:
t
RRD (Idd),
t
CK
1. Idd specifications are tested after the device is properly initialized. 0°C ≤ T
2. Vdd = +1.8V ±0.1V, VddQ = +1.8V ±0.1V, VddL = +1.8V ±0.1V, Vref = VddQ/2.
3. Idd parameters are specified with ODT disabled.
4. Data bus consists of DQ, DM, DQS, DQS#, RDQS, RDQS#, LDQS, LDQS#, UDQS, and
5. Definitions for Idd conditions:
6. Idd1, Idd4R, and Idd7 require A12 in EMR to be enabled during testing.
7. The following Idd values must be derated (Idd limits increase) on IT-option and AT-op-
UDQS#. Idd values must be met with all combinations of EMR bits 10 and 11.
tion devices when operated outside of the range 0°C ≤ T
LOW
HIGH
Stable
Floating
Switching Inputs changing between HIGH and LOW every other clock cycle (once per
Switching Inputs changing between HIGH and LOW every other data transfer (once
When
T
When
T
C
C
≤ 0°C
≥ 85°C
Symbol
Idd7
Idd2P and Idd3P (slow) must be derated by 4 percent; Idd4R and Idd5W
must be derated by 2 percent; and Idd6 and Idd7 must be derated by 7 percent
Idd0, Idd1, Idd2N, Idd2Q, Idd3N, Idd3P (fast), Idd4R, Idd4W, and Idd5W
must be derated by 2 percent; Idd2P must be derated by 20 percent; Idd3P
slow must be derated by 30 percent; and Idd6 must be derated by 80 per-
cent (Idd6 will increase by this amount if T
option is still enabled)
Vin ≤ Vil(AC) MAX
Vin ≥ Vih(AC) MIN
Inputs stable at a HIGH or LOW level
Inputs at Vref = VddQ/2
two clocks) for address and control signals
per clock) for DQ signals, not including masks or strobes
Configuration
x4, x8
x16
30
Electrical Specifications – Idd Parameters
-187E
425
520
Micron Technology, Inc. reserves the right to change products or specifications without notice.
-25E/
335
440
-25
1Gb: x4, x8, x16 DDR2 SDRAM
-3E/
280
350
-3
C
< 85°C and the 2X refresh
C
≤ 85°C:
© 2004 Micron Technology, Inc. All rights reserved.
-37E
270
330
260
300
-5E
C
≤ +85°C.
Units
mA

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